Search Results - Basinger, Jay

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  1. 1
    Pattern Center Determination in Electron Backscatter Diffraction Microscopy

    Pattern Center Determination in Electron Backscatter Diffraction Microscopy by Basinger, Jay, Fullwood, David, Kacher, Josh, Adams, Brent

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  2. 2
    Reply to comment by Maurice et al. in response to “Bragg’s Law Diffraction Simulations for Electron Backscatter Diffraction Analysis”

    Reply to comment by Maurice et al. in response to “Bragg’s Law Diffraction Simulations for Electron Backscatter Diffraction Analysis” by Kacher, Josh, Basinger, Jay, Adams, Brent L., Fullwood, David T.

    Published in Ultramicroscopy
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  3. 3
    Grain boundary character distribution in the heat-affected zone of friction stir-processed AL 7075 T7

    Grain boundary character distribution in the heat-affected zone of friction stir-processed AL 7075 T7 by BASINGER, J. A, ADAMS, B. L

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  4. 4
    Networking Consumer Systems to Provide a Development Environment for Inside-Out Marker-Less Tracking for Virtual Reality Headsets

    Networking Consumer Systems to Provide a Development Environment for Inside-Out Marker-Less Tracking for Virtual Reality Headsets by Rasmussen, Loki, Basinger, Jay, Milanova, Mariofanna

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  5. 5
    Classical Novae Masquerading as Dwarf Novae? Outburst Properties of Cataclysmic Variables with ASAS-SN

    Classical Novae Masquerading as Dwarf Novae? Outburst Properties of Cataclysmic Variables with ASAS-SN by Kawash, Adam, Chomiuk, Laura, Strader, Jay, Aydi, Elias, Sokolovsky, Kirill V, Jayasinghe, Tharindu, Kochanek, Chris S, Schmeer, Patrick, Stanek, Krzysztof Z, Mukai, Koji, Shappee, Ben, Way, Zachary, Basinger, Connor, Holoien, Tom W -S, Prieto, Jose L

    Published in arXiv.org
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