Search Results - Basker, V.S.

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  1. 1
    Challenges and solutions of FinFET integration in an SRAM cell and a logic circuit for 22 nm node and beyond

    Challenges and solutions of FinFET integration in an SRAM cell and a logic circuit for 22 nm node and beyond by Kawasaki, H., Basker, V.S., Yamashita, T., Lin, C.-H., Zhu, Y., Faltermeier, J., Schmitz, S., Cummings, J., Kanakasabapathy, S., Adhikari, H., Jagannathan, H., Kumar, A., Maitra, K., Wang, J., Yeh, C.-C., Wang, C., Khater, M., Guillorn, M., Fuller, N., Chang, J., Chang, L., Muralidhar, R., Yagishita, A., Miller, R., Ouyang, Q., Zhang, Y., Paruchuri, V.K., Bu, H., Doris, B., Takayanagi, M., Haensch, W., McHerron, D., O'Neill, J., Ishimaru, K.

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    Role of oxygen vacancies in V/sub FB//V/sub t/ stability of pFET metals on HfO/sub 2

    Role of oxygen vacancies in V/sub FB//V/sub t/ stability of pFET metals on HfO/sub 2 by Cartier, E., McFeely, F.R., Narayanan, V., Jamison, P., Linder, B.P., Copel, M., Paruchuri, V.K., Basker, V.S., Haight, R., Lim, D., Carruthers, R., Shaw, T., Steen, M., Sleight, J., Rubino, J., Deligianni, H., Guha, S., Jammy, R., Shahidi, G.

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