Search Results - Beh, M.T.F.

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    Scanning capacitance microscopy analysis of dram trench capacitors

    Scanning capacitance microscopy analysis of dram trench capacitors by Pey, K.L., Strausser, Y.E., Erickson, A.N., Leslie, A.J., Beh, M.T.F., Sheng, T.T.

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    Conference Proceeding
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