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Characterization and modeling of parasitic emission in deep submicron CMOS
by
Vrignon, B.
,
Bendhia, S.D.
,
Lamoureux, E.
,
Sicard, E.
Published in
IEEE transactions on electromagnetic compatibility
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Ieee Transactions On Electromagnetic Compatibility
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Applied Sciences
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Cmos Integrated Circuits
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Complementary Metal-Oxide Semiconductor Technology
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Design. Technologies. Operation Analysis. Testing
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Electromagnetic Compatability
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Electromagnetic Compatibility
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Integrated Circuit Noise
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Interference Suppression
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Linear Circuits
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On-Chip Sampling
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