Search Results - Bendwell, Nancy

  • Showing 1 - 2 results of 2
Refine Results
  1. 1
    Application of PARAFAC2 to fault detection and diagnosis in semiconductor etch

    Application of PARAFAC2 to fault detection and diagnosis in semiconductor etch by Wise, Barry M., Gallagher, Neal B., Martin, Elaine B.

    Get full text
    Items that this one cites
    Items that cite this one
    Article
    Save to List
    Saved in:
  2. 2
    The GIFI approach to non-linear PLS modeling

    The GIFI approach to non-linear PLS modeling by Berglund, Anders, Kettaneh, Nouna, Uppgård, Lise-Lott, Wold, Svante, Bendwell, Nancy, Cameron, Dave R.

    Get full text
    Items that this one cites
    Items that cite this one
    Article
    Save to List
    Saved in:

Search Tools: