Search Results - Benware, Brady

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  1. 1
    Automatic Identification of Yield Limiting Layout Patterns Using Root Cause Deconvolution on Volume Scan Diagnosis Data

    Automatic Identification of Yield Limiting Layout Patterns Using Root Cause Deconvolution on Volume Scan Diagnosis Data by Wu-Tung Cheng, Klingenberg, Randy, Benware, Brady, Wu Yang, Sharma, Manish, Eide, Geir, Yue Tian, Reddy, Sudhakar M., Yan Pan, Fernandes, Sherwin, Chittora, Atul

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  2. 2
    Scan Chain Diagnosis Based on Unsupervised Machine Learning

    Scan Chain Diagnosis Based on Unsupervised Machine Learning by Yu Huang, Benware, Brady, Klingenberg, Randy, Huaxing Tang, Dsouza, Jayant, Wu-Tung Cheng

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  3. 3
    Diagnosing Cell Internal Defects Using Analog Simulation-Based Fault Models

    Diagnosing Cell Internal Defects Using Analog Simulation-Based Fault Models by Huaxing Tang, Benware, Brady, Reese, Michael, Caroselli, Joseph, Herrmann, Thomas, Hapke, Friedrich, Tao, Robert, Wu-Tung Cheng, Sharma, Manish

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  4. 4
    Innovative practices session 2C: Advanced in yield learning

    Innovative practices session 2C: Advanced in yield learning by Lin, Yen-Tzu, Benware, Brady, Stine, Brian, Bhavnagarwala, Azeez

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  5. 5
    Improved volume diagnosis throughput using dynamic design partitioning

    Improved volume diagnosis throughput using dynamic design partitioning by Xiaoxin Fan, Huaxing Tang, Yu Huang, Wu-Tung Cheng, Reddy, S. M., Benware, B.

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  6. 6
    Bridging DFM Analysis and Volume Diagnostics for Yield Learning - A Case Study

    Bridging DFM Analysis and Volume Diagnostics for Yield Learning - A Case Study by Turakhia, R., Ward, M., Goel, S.K., Benware, B.

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  7. 7
    Innovative practices session 9C: Yield improvement: Challenges and directions

    Innovative practices session 9C: Yield improvement: Challenges and directions by Seshadri, B., Cory, B., Mitra, S.

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  8. 8
    Fault Diagnosis with Orthogonal Compactors in Scan-Based Designs

    Fault Diagnosis with Orthogonal Compactors in Scan-Based Designs by Benware, Brady, Mrugalski, Grzegorz, Pogiel, Artur, Rajski, Janusz, Solecki, Jędrzej, Tyszer, Jerzy

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  9. 9
    Impact of multiple-detect test patterns on product quality

    Impact of multiple-detect test patterns on product quality by Benware, B., Schuermyer, C., Tamarapalli, N., Kun-Han Tsai, Ranganathan, S., Madge, R., Rajski, J., Krishnamurthy, P.

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  10. 10
    A Rapid Yield Learning Flow Based on Production Integrated Layout-Aware Diagnosis

    A Rapid Yield Learning Flow Based on Production Integrated Layout-Aware Diagnosis by Keim, M., Tamarapalli, N., Tang, H., Sharma, M., Rajski, J., Schuermyer, C., Benware, B.

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  11. 11
    A novel Test Access Mechanism for failure diagnosis of multiple isolated identical cores

    A novel Test Access Mechanism for failure diagnosis of multiple isolated identical cores by Sharma, M., Dutta, A., Wu-Tung Cheng, Benware, B., Kassab, M.

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  12. 12
    Distributed dynamic partitioning based diagnosis of scan chain

    Distributed dynamic partitioning based diagnosis of scan chain by Yu Huang, Xiaoxin Fan, Huaxing Tang, Sharma, M., Wu-Tung Cheng, Benware, B., Reddy, S. M.

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  13. 13
    Enhancing Transition Fault Model for Delay Defect Diagnosis

    Enhancing Transition Fault Model for Delay Defect Diagnosis by Wu-Tung Cheng, Benware, B., Ruifeng Guo, Kun-Han Tsai, Kobayashi, T., Maruo, K., Nakao, M., Fukui, Y., Otake, H.

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  14. 14
    On Using Design Partitioning to Reduce Diagnosis Memory Footprint

    On Using Design Partitioning to Reduce Diagnosis Memory Footprint by Xiaoxin Fan, Huaxing Tang, Reddy, S. M., Wu-Tung Cheng, Benware, B.

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  15. 15
    Efficiently Performing Yield Enhancements by Identifying Dominant Physical Root Cause from Test Fail Data

    Efficiently Performing Yield Enhancements by Identifying Dominant Physical Root Cause from Test Fail Data by Sharma, M., Benware, B., Lei Ling, Abercrombie, D., Lee, L., Keim, M., Huaxing Tang, Wu-Tung Cheng, Ting-Pu Tai, Yi-Jung Chang, Lin, R., Man, A.

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  16. 16
    Determining a Failure Root Cause Distribution From a Population of Layout-Aware Scan Diagnosis Results

    Determining a Failure Root Cause Distribution From a Population of Layout-Aware Scan Diagnosis Results by Benware, B., Schuermyer, C., Sharma, M., Herrmann, T.

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  17. 17
    Achieving sub 100 DPPM defect levels on VDSM and nanometer ASICs

    Achieving sub 100 DPPM defect levels on VDSM and nanometer ASICs by Benware, B.R.

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  18. 18
    Defect screening using independent component analysis on I/sub DDQ

    Defect screening using independent component analysis on I/sub DDQ by Turakhia, R., Benware, B., Madge, R., Shannon, T., Daasch, R.

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  19. 19
    In search of the optimum test set - adaptive test methods for maximum defect coverage and lowest test cost

    In search of the optimum test set - adaptive test methods for maximum defect coverage and lowest test cost by Madge, R., Benware, B., Turakhia, R., Daasch, R., Schuermyer, C., Ruffler, J.

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  20. 20
    Case study of scan chain diagnosis and PFA on a low yield wafer

    Case study of scan chain diagnosis and PFA on a low yield wafer by Yu Huang, Benware, B, Wu-Tung Cheng, Ting-Pu Tai, Feng-Ming Kuo, Yuan-Shih Chen

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