Search Results - Bertrand-Giuliani, Christelle

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    Multi-Scale Thickness and Roughness Characterization of Thin Silicon-On-Insulator Films

    Multi-Scale Thickness and Roughness Characterization of Thin Silicon-On-Insulator Films by Acosta-Alba, Pablo E., Kononchuk, Oleg, Riou, Grégory, Moulin, Cécile, Bertrand-Giuliani, Christelle, Claverie, Alain

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