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Digital speckle pattern interferometry (DSPI): A fast procedure to detect and measure vibration mode shapes
by
Slangen, Pierre
,
Berwart, Léon
,
de Veuster, Christophe
,
Golinval, Jean-Claude
,
Lion, Yves
Published in
Optics and lasers in engineering
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Computer-aided interferometric measurements of drift and phase shifter calibration for digital speckle pattern interferometry
by
Slangen, Pierre R
,
De Veuster, Christophe
,
Renotte, Yvon L. M
,
Berwart, Leon
,
Lion, Yves F
Published in
Optical Engineering
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Influence of the geometry of illumination and viewing beams on displacement measurement errors in interferometric metrology
by
De Veuster, Ch
,
Slangen, P.
,
Renotte, Y.
,
Berwart, L.
,
Lion, Y.
Published in
Optics communications
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Disks growing algorithm for phase-unwrapping: Application to speckle interferograms
by
De Veuster, Christophe
,
Slangen, Pierre
,
Renotte, Yvon
,
Berwart, Léon
,
Lion, Yves
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Computer-aided interferometric measurements of drift and phase shifter calibration for DSPI (Digital Speckle Pattern Interferometry)
by
Slangen, Pierre
,
De Veuster, Christophe
,
Renotte, Yvon
,
Berwart, Léon
,
Lion, Yves
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An Unusual Rearrangement Leading to Ortho-Thiomethylation of Arylacetic Acid Derivatives
by
Bourgaux, Manuel
,
Gillet-Berwart, Anne-Françoise
,
Marchand-Brynaert, Jacqueline
,
Ghosez, Léon
Published in
Synlett
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