Search Results - Besacier, M.

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  1. 1
    Data fusion by artificial neural network for hybrid metrology development

    Data fusion by artificial neural network for hybrid metrology development by Penlap Woguia, Lucien, Rêche, Jerome, Besacier, Maxime, Gergaud, Patrice, Rademaker, Guido

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  2. 2
    Multi-branch neural network for hybrid metrology improvement

    Multi-branch neural network for hybrid metrology improvement by Digraci, Paul, Besacier, Maxime, Gergaud, Patrice, Rademaker, Guido, Rêche, Jérôme

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  3. 3
    Scatterometric porosimetry: A new characterization technique for porous material patterned structures

    Scatterometric porosimetry: A new characterization technique for porous material patterned structures by Bouyssou, R., El Kodadi, M., Licitra, C., Chevolleau, T., Besacier, M., Posseme, N., Joubert, O., Schiavone, P.

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  4. 4
    Application of scatterometric porosimetry to characterize porous ultra low-k patterned layers

    Application of scatterometric porosimetry to characterize porous ultra low-k patterned layers by Licitra, C., Bouyssou, R., El Kodadi, M., Haberfehlner, G., Chevolleau, T., Hazart, J., Virot, L., Besacier, M., Schiavone, P., Bertin, F.

    Published in Thin solid films
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  5. 5
    Resist trimming etch process control using dynamic scatterometry

    Resist trimming etch process control using dynamic scatterometry by El kodadi, M., Soulan, S., Besacier, M., Schiavone, P.

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  6. 6
    Real time scatterometry for profile control during resist trimming process

    Real time scatterometry for profile control during resist trimming process by El Kodadi, M., Soulan, S., Besacier, M., Schiavone, P.

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  7. 7
    Development of Porosimetry Techniques for the Characterization of Plasma-Treated Porous Ultra Low-k Materials

    Development of Porosimetry Techniques for the Characterization of Plasma-Treated Porous Ultra Low-k Materials by Licitra, Christophe, Chevolleau, Thierry, Bouyssou, Regis, El Kodadi, Mohamed, Haberfehlner, Georg, Hazart, Jerome, Virot, Leopold, Besacier, Maxime, Posseme, Nicolas, Darnon, Maxime, Hurand, Romain, Schiavone, Patrick, Bertin, Francois

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  8. 8
    Etching process scalability and challenges for ULK materials

    Etching process scalability and challenges for ULK materials by Chevolleau, T, Posseme, N, David, T, Bouyssou, R, Ducote, J, Bailly, F, Darnon, M, El Kodadi, M, Besacier, M, Licitra, C, Guillermet, M, Ostrovsky, A, Verove, C, Joubert, O

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  9. 9
    Hybrid Si-SiC fast switching cell modelling and characterisation including parasitic environment description by PEEC method

    Hybrid Si-SiC fast switching cell modelling and characterisation including parasitic environment description by PEEC method by Besacier, M., Coyaud, M., Schanen, J.L., Roudet, J., Rivet, B.

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  10. 10
    Scatterometric Porosimetry for porous low-k patterns characterization

    Scatterometric Porosimetry for porous low-k patterns characterization by Hurand, R., Bouyssou, R., Darnon, M., Tiphine, C., Licitra, C., El-kodadi, M., Chevolleau, T., David, T., Posseme, N., Besacier, M., Schiavone, P., Bailly, F., Joubert, O., Verove, C.

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  11. 11
    3D rigorous simulation of EUV defective masks using modal method by Fourier expansion

    3D rigorous simulation of EUV defective masks using modal method by Fourier expansion by Smaali, R., Besacier, M., Granet, G., Schiavone, P.

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  12. 12
    Printability of nonsmoothed buried defects in extreme ultraviolet lithography mask blanks

    Printability of nonsmoothed buried defects in extreme ultraviolet lithography mask blanks by Farys, Vincent, Charpin-Nicolle, Christelle, Richard, Marieke, Robic, Jean-Yves, Muffato, Viviane, Quesnel, Etienne, Postnikov, Sergeï, Schiavone, Patrick, Besacier, Maxime, Smaali, Rafik, Naulleau, Patrick

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  13. 13
    PSPICE-compatible electrical equivalent circuit for busbars

    PSPICE-compatible electrical equivalent circuit for busbars by Besacier, M., Schanen, J.L., Roudet, J., Suau, P., Crebier, J.C.

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  14. 14
    Variational Inference for Acoustic Unit Discovery

    Variational Inference for Acoustic Unit Discovery by Ondel, Lucas, Burget, Lukaš, Černocký, Jan

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  15. 15
    Investigating Bilingual Deep Neural Networks for Automatic Recognition of Code-switching Frisian Speech

    Investigating Bilingual Deep Neural Networks for Automatic Recognition of Code-switching Frisian Speech by Yılmaz, Emre, van den Heuvel, Henk, van Leeuwen, David

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  16. 16
    Breaking the Unwritten Language Barrier: The BULB Project

    Breaking the Unwritten Language Barrier: The BULB Project by Adda, Gilles, Stüker, Sebastian, Adda-Decker, Martine, Ambouroue, Odette, Besacier, Laurent, Blachon, David, Bonneau-Maynard, Hélène, Godard, Pierre, Hamlaoui, Fatima, Idiatov, Dmitry, Kouarata, Guy-Noël, Lamel, Lori, Makasso, Emmanuel-Moselly, Rialland, Annie, Van de Velde, Mark, Yvon, François, Zerbian, Sabine

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  17. 17
    The Zero Resource Speech Challenge 2015: Proposed Approaches and Results

    The Zero Resource Speech Challenge 2015: Proposed Approaches and Results by Versteegh, Maarten, Anguera, Xavier, Jansen, Aren, Dupoux, Emmanuel

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  18. 18
    Information extraction from sound for medical telemonitoring

    Information extraction from sound for medical telemonitoring by Istrate, D., Castelli, E., Vacher, M., Besacier, L., Serignat, J.-F.

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  19. 19
    Parallel Speech Collection for Under-resourced Language Studies Using the Lig-Aikuma Mobile Device App

    Parallel Speech Collection for Under-resourced Language Studies Using the Lig-Aikuma Mobile Device App by Blachon, David, Gauthier, Elodie, Besacier, Laurent, Kouarata, Guy-Noël, Adda-Decker, Martine, Rialland, Annie

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  20. 20
    Unsupervised Linear Discriminant Analysis for Supporting DPGMM Clustering in the Zero Resource Scenario

    Unsupervised Linear Discriminant Analysis for Supporting DPGMM Clustering in the Zero Resource Scenario by Heck, Michael, Sakti, Sakriani, Nakamura, Satoshi

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