Radiation hardness of silicon detectors for high-energy physics applications by Candelori, A., Bisello, D., Rando, R., Kaminski, A., Wyss, J., Litovchenko, A., Betta, G.D., Lozano, M., Boscardin, M., Martinez, C., Ullan, M., Zorzi, N.

Get full text

Lithium ion irradiation of standard and oxygenated silicon diodes by Candelori, A., Bisello, D., Betta, G.D., Giubilato, P., Kaminski, A., Litovchenko, A., Lozano, M., Petrie, J.R., Rando, R., Ullan, M., Wyss, J.

Get full text

PIN diode and integrated JFET on high resistivity silicon: a new test structure by Fazzi, A., Betta, G.D., Pignatel, G.U., Boscardin, M., Gregori, P., Zorzi, N.

Request full text

Contributors by Alvarez, R., Betta, F., Brown, J., Cowley, M., Grove, W.M., Iga, K., Jones, R.R., Lavedan, L.J., Lepoff, J.H., McManus, J.W., Mohr, M.C., Monaghan, S.R., Okwit, S., Passaro, W.C., Joe K. Parks, Peyton, B.J., Robinson, S.A., Sard, E.W., Savage, B.R., Sorensen, H.O., Suematsu, Y., Temme, D.H., Tresselt, C.P., Vendelin, G.D., Weaver, J.N., Weiss, J.A., Wenzel, R.J., Ito, S.

Get full text