Search Results - Bianc, Giuseppe Bertolotto

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  1. 1
    Simulation of monolithic silicon LLL scanning X-ray interferometer

    Simulation of monolithic silicon LLL scanning X-ray interferometer by BIANC, G. B, MANA, G, ZOSI, G

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  2. 2
    Measurement of the intrinsic mechanical loss of low-loss samples using a nodal support

    Measurement of the intrinsic mechanical loss of low-loss samples using a nodal support by Numata, Kenji, Bianc, Giuseppe Bertolotto, Ohishi, Naoko, Sekiya, Atsushi, Otsuka, Shigemi, Kawabe, Keita, Ando, Masaki, Tsubono, Kimio

    Published in Physics letters. A
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  3. 3
    Measurement of the mechanical loss of crystalline samples using a nodal support

    Measurement of the mechanical loss of crystalline samples using a nodal support by Numata, Kenji, Bertolotto Bianc, Giuseppe, Tanaka, Mitsuru, Otsuka, Shigemi, Kawabe, Keita, Ando, Masaki, Tsubono, Kimio

    Published in Physics letters. A
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