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Search Results - Bimbault, L.
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Poisson’s ratio measurement in tungsten thin films combining an x-ray diffractometer with in situ tensile tester
by
Renault, P.-O.
,
Badawi, K. F.
,
Bimbault, L.
,
Goudeau, Ph
,
Elkaı̈m, E.
,
Lauriat, J. P.
Published in
Applied physics letters
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Crystalline quality and residual stresses in diamond layers by Raman and x-ray diffraction analyses
by
Rats, D.
,
Bimbault, L.
,
Vandenbulcke, L.
,
Herbin, R.
,
Badawi, K. F.
Published in
Journal of applied physics
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Profile analysis of thin film X-ray diffraction peaks
by
Bimbault, L.
,
Badawi, K.F.
,
Goudeau, Ph
,
Branger, V.
,
Durand, N.
Published in
Thin solid films
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Stress and microstructure in YBaCuO thin films on MgO and SrTiO 3 substrates studied by X-ray diffraction and bending tests
by
Auzary, S.
,
Badawi, F.
,
Bimbault, L.
,
Rabier, J.
,
Gaboriaud, R.J.
Published in
Journal of alloys and compounds
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Stress and microstructure in YBaCuO thin films on MgO and SrTiO3 substrates studied by X-ray diffraction and bending tests
by
Auzary, S.
,
Badawi, F.
,
Bimbault, L.
,
Rabier, J.
,
Gaboriaud, R.J.
Published in
Journal of alloys and compounds
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Journal Of Alloys And Compounds
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Applied Physics Letters
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Thin Solid Films
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Physical Sciences
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Science & Technology
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Lattice Parameters
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Ybacuo Thin Films
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Condensed Matter: Structure, Mechanical And Thermal Properties
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Exact Sciences And Technology
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Gold
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Platinum
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Structure And Morphology; Thickness
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Thin Film Structure And Morphology
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Backfile Package - Materials Science [Yms]
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American Institute Of Physics:jisc Collections:transitional Journals Agreement 2021-23 (Reading List)
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Aip Digital Archive
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Backfile Package - Physics General (Legacy) [Ypa]
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