Search Results - Bin-Chung Ouyang

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    Validation of kill-rate and yield model for clustering visual defects in semiconductor manufacturing

    Validation of kill-rate and yield model for clustering visual defects in semiconductor manufacturing by Chi-Hao Yeh, Cheng-Hsiung Chen, Ful-Chiang Wu, Rei-Lung Lai, Bin-Chung Ouyang

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    How Do Pronouns Affect Word Embedding

    How Do Pronouns Affect Word Embedding by Chung, Tonglee, Xu, Bin, Liu, Yongbin, Li, Juanzi, Ouyang, Chunping

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