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Nanoscale multiply charged focused ion beam platform for surface modification, implantation, and analysis
by
Lalande, Mathieu
,
Salou, Pierre
,
Houel, Arnaud
,
Been, Thierry
,
Birou, Thierry
,
Bourin, Charles
,
Cassimi, Amine
,
Keizer, Arthur
,
Mellier, Jean-Baptiste
,
Ramillon, Jean-Marc
,
Sineau, Anthony
,
Delobbe, Anne
,
Guillous, Stéphane
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Review of scientific instruments
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Review Of Scientific Instruments
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Review Of Scientific Instruments Online/Review Of Scientific Instruments
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Atomic Force Microscopes
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Image Resolution
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Ion Beams
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