The iMPACT project tracker and calorimeter by Mattiazzo, S., Bisello, D., Giubilato, P., Pantano, D., Pozzobon, N., Snoeys, W.

Get full text

Total Ionizing Dose effects on a 28 nm Hi-K metal-gate CMOS technology up to 1 Grad by Mattiazzo, S., Bagatin, M., Bisello, D., Gerardin, S., Marchioro, A., Paccagnella, A., Pantano, D., Pezzotta, A., Zhang, C-M., Baschirotto, A.

Get full text

LINUS, the Integrated LNL Neutron Source facility by Bisello, D., Fagotti, E., Esposito, J., Loong, C-K., Maggiore, M., Mastinu, P., Prete, G., Silvestrin, L., Wyss, J.

Get full text

SIRAD: an irradiation facility at the LNL Tandem accelerator for radiation damage studies on semiconductor detectors and electronic devices and systems by Wyss, J, Bisello, D, Pantano, D

Get full text

LePix—A high resistivity, fully depleted monolithic pixel detector by Giubilato, P., Bisello, D., Chalmet, P., Denes, P., Kloukinas, K., Mattiazzo, S., Marchioro, A., Mugnier, H., Pantano, D., Potenza, A., Rivetti, A., Rousset, J., Snoeys, W., Tindall, C.

Get full text

Advanced proton imaging in computed tomography by Mattiazzo, S, Bisello, D, Giubilato, P, Pantano, D, Pozzobon, N, Snoeys, W, Wyss, J

Get full text

Recent progress of RD53 Collaboration towards next generation Pixel Read-Out Chip for HL-LHC by Demaria, N., Barbero, M.B., Fougeron, D., Gensolen, F., Godiot, S., Menouni, M., Pangaud, P., Rozanov, A., Wang, A., Bomben, M., Calderini, G., Crescioli, F., Dortz, O. Le, Marchiori, G., Dzahini, D., Rarbi, F.E., Gaglione, R., Gonella, L., Hemperek, T., Huegging, F., Karagounis, M., Kishishita, T., Krueger, H., Rymaszewski, P., Wermes, N., Ciciriello, F., Corsi, F., Marzocca, C., Robertis, G. De, Loddo, F., Licciulli, F., Andreazza, A., Liberali, V., Shojaii, S., Stabile, A., Bagatin, M., Bisello, D., Mattiazzo, S., Ding, L., Gerardin, S., Giubilato, P., Neviani, A., Paccagnella, A., Vogrig, D., Wyss, J., Bacchetta, N., Canio, F. De, Gaioni, L., Nodari, B., Manghisoni, M., Re, V., Traversi, G., Comotti, D., Ratti, L., Vacchi, C., Beccherle, R., Bellazzini, R., Magazzu, G., Minuti, M., Morsani, F., Palla, F., Poulios, S., Fanucci, L., Rizzi, A., Saponara, S., Androsov, K., Bilei, G.M., Menichelli, M., Conti, E., Marconi, S., Passeri, D., Placidi, P., Casa, G. Della, Mazza, G., Rivetti, A., Rolo, M.D. Da Rocha, Monteil, E., Pacher, L., Gajanana, D., Gromov, V., Hessey, N., Kluit, R., Zivkovic, V., Havranek, M., Janoska, Z., Marcisovsky, M., Neue, G., Tomasek, L., Kafka, V., Sicho, P., Vrba, V., Vila, I., Lopez-Morillo, E., Aguirre, M.A., Palomo, F.R., Muñoz, F., Abbaneo, D., Christiansen, J., Dannheim, D., Dobos, D.

Get full text

80: ProXY – High performance monolithic pixel tracker for proton tomography by Giubilato, P, Bisello, D, Mattiazzo, S, Pantano, D, Pozzobon, N, Snoeys, W, Wyss, J

Get full text

Radiation hard silicon detectors—developments by the RD48 (ROSE) collaboration by Lindström, G, Ahmed, M, Albergo, S, Anderson, D, Augelli, V, Bacchetta, N, Bartalini, P, Bates, R, Biggeri, U, Bisello, D, Boemi, D, Borchi, E, Burger, P, Campabadal, F, Chilingarov, A, Ciampolini, P, Cindro, V, Creanza, D, Da Via, C, Davies, G, De Boer, W, Dell’Orso, R, Dezillie, B, Eremin, V, Evrard, O, Fanourakis, G, Feick, H, Focardi, E, Fonseca, L, Fretwurst, E, Fuster, J, Gabathuler, K, Glaser, M, Hall, G, Heising, S, Holmes-Siedle, A, Hughes, G, Jones, B.K, Jungermann, L, Kohout, Z, Kramberger, G, Kuhnke, M, Kwan, S, Lemeilleur, F, Leroy, C, Li, Z, Ligonzo, T, Linhart, V, Litovchenko, P, Loukas, D, Lozano, M, Luczynski, Z, Lutz, G, MacEvoy, B, Manolopoulos, S, Markou, A, Martinez, C, Messineo, A, Moll, M, Oshea, V, Parrini, G, Passeri, D, Petre, D, Pickford, A, Pintilie, I, Pospisil, S, Raine, C, Ratoff, P.N, Richter, R.H, Roy, P, Ruzin, A, Ryazanov, A.I, Santocchia, A, Schiavulli, L, Sicho, P, Slysz, W, Smith, K, Stolze, K, Sundby Avset, B, Svensson, B, Tivarus, C, Tricomi, A, Tzamarias, S, Valvo, G, Vasilescu, A, Vayaki, A, Verbitskaya, E, Verdini, P, Vrba, V, Watts, S, Weber, E.R, Wegrzecki, M, Wegrzecka, I, Wheadon, R, Wilhelm, I, Wunstorf, R, Wüstenfeld, J, Wyss, J, Zankel, K, Žontar, D

Get full text

Measurement of the Dipion Mass Spectrum in X ( 3872 ) → J / ψ π + π − Decays by Abulencia, A., Acosta, D., Adelman, J., Affolder, T., Akimoto, T., Albrow, M. G., Ambrose, D., Amerio, S., Amidei, D., Anastassov, A., Anikeev, K., Annovi, A., Antos, J., Aoki, M., Apollinari, G., Arguin, J.-F., Arisawa, T., Artikov, A., Ashmanskas, W., Attal, A., Azfar, F., Azzi-Bacchetta, P., Azzurri, P., Bacchetta, N., Bachacou, H., Badgett, W., Barbaro-Galtieri, A., Barnes, V. E., Barnett, B. A., Baroiant, S., Bartsch, V., Bauer, G., Bedeschi, F., Behari, S., Belforte, S., Bellettini, G., Bellinger, J., Belloni, A., Ben Haim, E., Benjamin, D., Beretvas, A., Beringer, J., Berry, T., Bhatti, A., Binkley, M., Bisello, D., Bishai, M., Blair, R. E., Blocker, C., Bloom, K., Blumenfeld, B., Bocci, A., Bodek, A., Boisvert, V., Bolla, G., Bolshov, A., Bortoletto, D., Boudreau, J., Bourov, S., Boveia, A., Brau, B., Bromberg, C., Brubaker, E., Budagov, J., Budd, H. S., Budd, S., Burkett, K., Busetto, G., Bussey, P., Byrum, K. L., Cabrera, S., Campanelli, M., Campbell, M., Canelli, F., Canepa, A., Carlsmith, D., Carosi, R., Carron, S., Casarsa, M., Castro, A., Catastini, P., Cauz, D., Cavalli-Sforza, M., Cerri, A., Cerrito, L., Chang, S. H., Chapman, J., Chen, Y. C., Chertok, M., Chiarelli, G., Chlachidze, G., Chlebana, F., Cho, I., Cho, K., Chokheli, D., Chou, J. P., Chu, P. H., Chuang, S. H., Chung, K., Chung, W. H.

Get full text

LePIX: First results from a novel monolithic pixel sensor by Mattiazzo, S., Battaglia, M., Bisello, D., Caselle, M., Chalmet, P., Demaria, N., Giubilato, P., Ikemoto, Y., Kloukinas, K., Mansuy, C., Marchioro, A., Mugnier, H., Pantano, D., Potenza, A., Rivetti, A., Rousset, J., Silvestrin, L., Snoeys, W., Wyss, J.

Get full text

SPES and the neutron facilities at Laboratori Nazionali di Legnaro by Silvestrin, L., Bisello, D., Esposito, J., Mastinu, P., Prete, G., Wyss, J.

Get full text

Monolithic pixels on moderate resistivity substrate and sparsifying readout architecture by Giubilato, P., Battaglia, M., Bisello, D., Caselle, M., Chalmet, P., Demaria, L., Ikemoto, Y., Kloukinas, K., Mansuy, S.C., Mattiazzo, S., Marchioro, A., Mugnier, H., Pantano, D., Potenza, A., Rivetti, A., Rousset, J., Silvestrin, L., Snoeys, W.

Get full text

A DAQ system for pixel detectors R&D by Battaglia, M., Bisello, D., Contarato, D., Giubilato, P., Pantano, D., Tessaro, M.

Get full text

Investigation of Supply Current Spikes in Flash Memories Using Ion-Electron Emission Microscopy by Gerardin, S., Bagatin, M., Paccagnella, A., Bisello, D., Giubilato, P., Mattiazzo, S., Pantano, D., Silvestrin, L., Tessaro, M., Wyss, J., Ferlet-Cavrois, V.

Get full text

Radiation tolerance of a moderate resistivity substrate in a modern CMOS process by Potenza, A., Bisello, D., Caselle, M., Costa, M., Demaria, N., Giubilato, P., Ikemoto, Y., Mansuy, C., Marchioro, A., Mattiazzo, S., Moll, M., Pacher, L., Pacifico, N., Pantano, D., Rivetti, A., Silvestrin, L., Snoeys, W.

Get full text

Evidence for the Exclusive Decay B c ± → J / ψ π ± and Measurement of the Mass of the B c ± Meson by Abulencia, A., Acosta, D., Adelman, J., Affolder, T., Akimoto, T., Albrow, M. G., Ambrose, D., Amerio, S., Amidei, D., Anastassov, A., Anikeev, K., Annovi, A., Antos, J., Aoki, M., Apollinari, G., Arguin, J.-F., Arisawa, T., Artikov, A., Ashmanskas, W., Attal, A., Azfar, F., Azzi-Bacchetta, P., Azzurri, P., Bacchetta, N., Bachocou, H., Badgett, W., Barbaro-Galtieri, A., Barnes, V. E., Barnett, B. A., Baroiant, S., Bartsch, V., Bauer, G., Bedeschi, F., Behari, S., Belforte, S., Bellettini, G., Bellinger, J., Belloni, A., Ben-Haim, E., Benjamin, D., Beretvas, A., Beringer, J., Berry, T., Bhatti, A., Binkley, M., Bisello, D., Bishai, M., Blair, R. E., Blocker, C., Bloom, K., Blumenfeld, B., Bocci, A., Bodek, A., Boisvert, V., Bolla, G., Bolshov, A., Bortoletto, D., Boudreau, J., Bourov, S., Boveia, A., Brau, B., Bromberg, C., Brubaker, E., Budagov, J., Budd, H. S., Budd, S., Burkett, K., Busetto, G., Bussey, P., Byrum, K. L., Cabrera, S., Campanelli, M., Campbell, M., Canelli, F., Canepa, A., Carlsmith, D., Carosi, R., Carron, S., Casarsa, M., Castro, A., Catastini, P., Cauz, D., Cavalli-Sforza, M., Cerri, A., Cerrito, L., Chang, S. H., Chapman, J., Chen, Y. C., Chertok, M., Chiarelli, G., Chlachidze, G., Chlebana, F., Cho, I., Cho, K., Chokheli, D., Chou, J. P., Chu, P. H., Chuang, S. H., Chung, K., Chung, W. H.

Get full text

First results in micromapping the sensitivity to SEE of an electronic device in a SOI technology at the LNL IEEM by Mattiazzo, S., Bisello, D., Giubilato, P., Kaminsky, A., Pantano, D., Silvestrin, L., Tessaro, M., Wyss, J.

Get full text

CMOS sensors in 90 nm fabricated on high resistivity wafers: Design concept and irradiation results by Rivetti, A, Battaglia, M, Bisello, D, Caselle, M, Chalmet, P, Costa, M, Demaria, N, Giubilato, P, Ikemoto, Y, Kloukinas, K, Mansuy, C, Marchioro, A, Mugnier, H, Pantano, D, Potenza, A, Rousset, J, Silvestrin, L, Wyss, J

Get full text

Intermediate silicon layers detector for the CDF experiment by Affolder, A, Azzi-Bacchetta, P, Bacchetta, N, Barker, G, Barbaro-Galtieri, A, Basti, A, Bedeschi, F, Bisello, D, Blusk, S, Caskey, W.P, Chiarelli, G, Connolly, A, Demina, R, Ely, R, Field, R, Garcia-Sciveres, M, Giolo, K, Goldstein, D, Goldstein, J, Grim, G.P, Guerzoni, M, Haas, R, Haber, C, Hara, K, Hartmann, F, Heiss, A, Hill, C, Hrycyk, M, Incandela, J, Kato, Y, Knoblauch, D, Kruse, M, Lander, R.L, Lei, C.M, Leonardi, G.L, Leone, S, Miyazaki, Y, Moggi, A, Muller, T, Munar-Ara, A, Okusawa, T, Palmonari, F, Paulini, M, Piacentino, G, Pellett, D.E, Raffaelli, F, Roederer, F, Saltzberg, D, Shimojima, M, Stuart, D, Suzuki, H, Takano, T, Takikawa, K, Tanaka, M, Taniguchi, Y, Tipton, P, Turini, N, Volobouev, I, Wenzel, H, Wilkes, T.D, Yao, W, Yoshida, T, Zetti, F, Zucchelli, S

Get full text