Search Results - Blanc-Pelissier, D.

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  1. 1
    Field-effect passivation of Si by ALD-Al2O3: Second harmonic generation monitoring and simulation

    Field-effect passivation of Si by ALD-Al2O3: Second harmonic generation monitoring and simulation by Damianos, D., Vitrant, G., Kaminski-Cachopo, A., Blanc-Pelissier, D., Ghibaudo, G., Lei, M., Changala, J., Bouchard, A., Mescot, X., Gri, M., Cristoloveanu, S., Ionica, I.

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  2. 2
    Time-resolved photoluminescence for self-calibrated injection-dependent minority carrier lifetime measurements in silicon

    Time-resolved photoluminescence for self-calibrated injection-dependent minority carrier lifetime measurements in silicon by Parola, S, Daanoune, M, Kaminski-Cachopo, A, Lemiti, M, Blanc-Pélissier, D

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  3. 3
    Second Harmonic Generation characterization of SOI wafers: Impact of layer thickness and interface electric field

    Second Harmonic Generation characterization of SOI wafers: Impact of layer thickness and interface electric field by Damianos, D., Vitrant, G., Lei, M., Changala, J., Kaminski-Cachopo, A., Blanc-Pelissier, D., Cristoloveanu, S., Ionica, I.

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  4. 4
    Second harmonic generation for contactless non-destructive characterization of silicon on insulator wafers

    Second harmonic generation for contactless non-destructive characterization of silicon on insulator wafers by Damianos, D., Pirro, L., Soylu, G., Ionica, I., Nguyen, V., Vitrant, G., Kaminski, A., Blanc-Pelissier, D., Onestas, L., Changala, J., Kryger, M., Cristoloveanu, S.

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  5. 5
    Kinetics of light-induced degradation in compensated boron-doped silicon investigated using photoluminescence and numerical simulation

    Kinetics of light-induced degradation in compensated boron-doped silicon investigated using photoluminescence and numerical simulation by Fraser, K., Blanc-Pelissier, D., Dubois, S., Veirman, J., Lemiti, M.

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  6. 6
    (Invited) Non-Destructive Characterization of Dielectric - Semiconductor Interfaces by Second Harmonic Generation

    (Invited) Non-Destructive Characterization of Dielectric - Semiconductor Interfaces by Second Harmonic Generation by Ionica, Irina, Damianos, Dimitrios, Kaminski, Anne, Vitrant, Guy, Blanc-Pélissier, Danièle, Changala, John, Kryger, Marc, Barbos, Corina, Cristoloveanu, Sorin

    Published in ECS transactions
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  7. 7
    Minority Carrier Lifetime Measurement in Nanowire Based Solar Cells by a Reverse Recovery Transient Method

    Minority Carrier Lifetime Measurement in Nanowire Based Solar Cells by a Reverse Recovery Transient Method by Daanoune, M., Kohen, D., Kaminski-Cachopo, A., Morin, C., Faucherand, P., Perraud, S., Blanc-Pélissier, D.

    Published in Energy procedia
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  8. 8
    Layer thickness impact on Second Harmonic Generation characterization of SOI wafers

    Layer thickness impact on Second Harmonic Generation characterization of SOI wafers by Damianos, D., Ionica, I., Changala, J., Lei, M., Kaminski-Cachopo, A., Blanc-Pelissier, D., Cristoloveanu, S., Vitrant, G.

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  9. 9
    Self-Processing of Surface-Relief Gratings in Photosensitive Hybrid Sol-Gel Glasses

    Self-Processing of Surface-Relief Gratings in Photosensitive Hybrid Sol-Gel Glasses by Blanc, D., Pelissier, S., Saravanamuttu, K., Najafi, S. I., Andrews, M. P.

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