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High-performance fully-depleted SOI RF CMOS
by
Chen, C.L.
,
Spector, S.J.
,
Blumgold, R.M.
,
Neidhard, R.A.
,
Beard, W.T.
,
Yost, D.-R.
,
Knecht, J.M.
,
Chen, C.K.
,
Fritze, M.
,
Cerny, C.L.
,
Cook, J.A.
,
Wyatt, P.W.
,
Keast, C.L.
Published in
IEEE electron device letters
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Ieee Electron Device Letters
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Subjects
Cmos
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Cmos Process
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Compatibility
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Cutoff Frequency
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Depletion
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Engineering
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Engineering, Electrical & Electronic
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Etching
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Fabrication
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Fully-Depleted Soi
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Gates
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Laboratories
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Low-Noise Si Mosfet
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Microwave Mosfet
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Microwave T-Gate Fet
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Mosfet Circuits
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Mosfets
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