Search Results - Bolcskei-Molnar, Anna

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    M-FOUP SYSTEM performance in a semiconductor process control

    M-FOUP SYSTEM performance in a semiconductor process control by Lifshitz, Yevgeny, Alhasawi, Fahad, Novack, David, Downey, Jack, Byrnes, John, Hajtman, Alfred, Nandor Bitvai, Csaba, Bolcskei-Molnar, Anna, Nemeth, Istvan, Kover, Krisztina, Basa, Peter

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    Monitoring subwavelength grating structures for vertical-cavity surface-emitting laser applications by spectroscopic ellipsometry

    Monitoring subwavelength grating structures for vertical-cavity surface-emitting laser applications by spectroscopic ellipsometry by Balogh, Emeric, Basa, Peter, Suto, Attila, Powell, Benjamin, Bölcskei-Molnár, Anna, Biró, Szilvia

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