Search Results - Bonarski, J.T.

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  1. 1
    Utility Of Stress-Texture Characteristics Of Structural Materials By X-Ray Technique

    Utility Of Stress-Texture Characteristics Of Structural Materials By X-Ray Technique by Bonarski, J.T., Kania, B., Bolanowski, K., Karolczuk, A.

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  2. 2
    Materials Stress Diagnostics by X-Ray and Acoustic Techniques

    Materials Stress Diagnostics by X-Ray and Acoustic Techniques by Bonarski, J.T., Tarkowski, L., Pawlak, S., Rakowska, A., Major, Ł.

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  3. 3
    Materials Stress Diagnostics by X-Ray and Acoustic Techniques

    Materials Stress Diagnostics by X-Ray and Acoustic Techniques by Bonarski J.T., Tarkowski L., Pawlak S., Rakowska A., Major Ł.

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  4. 4
    Stress-textural indicators of tribological wear

    Stress-textural indicators of tribological wear by Starczewski, L, Bonarski, J.T, Ciach, R

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  5. 5
    New X-ray diffraction method for materials science

    New X-ray diffraction method for materials science by Swiatek, Z, Bonarski, J.T, Ciach, R, Kuznicki, Z.T

    Published in Thin solid films
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  6. 6
    Modification of a post-implantation defect activity for photovoltaic conversion

    Modification of a post-implantation defect activity for photovoltaic conversion by Kuznicki, Z.T., Thibault, J., Chautain-Mathys, F., Wu, L., Sidibé, S., de Unamuno, S., Bonarski, J.T., Swiatek, Z., Ciach, R.

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  7. 7
    Investigation of inhomogeneous structures of near-surface-layers in ion-implanted silicon

    Investigation of inhomogeneous structures of near-surface-layers in ion-implanted silicon by Swiatek, Z, Bonarski, J.T, Ciach, R, Kuznicki, Z.T, Fodchuk, I.M, Raransky, M.D, Gorley, P

    Published in Thin solid films
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