Semi-Empirical Method for Estimation of Single-Event Upset Cross Section for SRAM DICE Cells by Gorbunov, Maxim S., Boruzdina, Anna B., Dolotov, Pavel S.

Get full text

Design of 65 nm CMOS SRAM for Space Applications: A Comparative Study by Gorbunov, Maxim S., Dolotov, Pavel S., Antonov, Andrey A., Zebrev, Gennady I., Emeliyanov, Vladimir V., Boruzdina, Anna B., Petrov, Andrey G., Ulanova, Anastasia V.

Get full text

Temperature Dependence of MCU Sensitivity in 65 nm CMOS SRAM by Boruzdina, Anna B., Sogoyan, Armen V., Smolin, Anatoly A., Ulanova, Anastasia V., Gorbunov, Maxim S., Chumakov, Alexander I., Boychenko, Dmitry V.

Get full text

A simple analytical model of single-event upsets in bulk CMOS by Sogoyan, Armen V., Chumakov, Alexander I., Smolin, Anatoly A., Ulanova, Anastasia V., Boruzdina, Anna B.

Get full text

Design of 65 nm CMOS SRAM for space applications: A comparative study by Gorbunov, Maxim S., Dolotov, Pavel S., Antonov, Andrey A., Zebrev, Gennady I., Emeliyanov, Vladimir V., Boruzdina, Anna B., Petrov, Andrey G., Ulanova, Anastasia V.

Request full text

Verification of SRAM MСUs calculation technique for experiment time optimization by Boruzdina, Anna B., Ulanova, Anastasia V., Petrov, Andrey G., Telets, Vitaly A., Reviriego, Pedro, Maestro, Juan Antonio

Request full text

NI Based System for Seu Testing of Memory Chips for Avionics by Boruzdina, Anna, Yanenko, Andrey, Tikhomirov, Georgy, Tumanov, Vitaly

Get full text

Automated Data Processing System for Oscilloscope Measurements during an Environmental Test by Shmakov, Sergey, Cherniak, Maxim, Boruzdina, Anna, Skorobogatov, Peter, Nikiforov, Alexander

Get full text