Search Results - Boukhatem, M.H.

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    The Carriers Temperature as a New Parameter for Characterization

    The Carriers Temperature as a New Parameter for Characterization by Boukhatem, M.H., El Tahchi, M., Mialhe, P.

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    Conference Proceeding
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  2. 2
    Carriers temperature for an operating silicon p–n junction

    Carriers temperature for an operating silicon p–n junction by Boukhatem, M.H., El Tahchi, M., El Haj Moussa, G.W., Ajaka, M., Khoury, A., Mialhe, P.

    Published in Microelectronics
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