Search Results - Bowers, Mickey

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    Low-defect-density and high-reliability FETMOS EEPROM's fabricated using furnace N2O oxynitridation

    Low-defect-density and high-reliability FETMOS EEPROM's fabricated using furnace N2O oxynitridation by YEONG-SEUK KIM, OKADA, Y, YEARGAIN, J. R, KO-MIN CHANG, TOBIN, P. J, MORTON, B, CHOE, H, BOWERS, M, KUO, C, CHRUDIMSKY, D, AJURIA, S. A

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    Low-defect-density and high-reliability FETMOS EEPROM's fabricated using furnace N sub(2)O oxynitridation

    Low-defect-density and high-reliability FETMOS EEPROM's fabricated using furnace N sub(2)O oxynitridation by Kim, Yeong-Seuk, Okada, Yoshio, Chand, Ko-Ming, Tobin Philip, J, Morton, Bruce, Choe, Henry, Bowers, Mickey, Kuo, Clinton, Chrudimsky, David

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    New submicron non-volatile memory modules for 16/32-bit devices

    New submicron non-volatile memory modules for 16/32-bit devices by Kuo, C., Morton, B., Toms, T., Weidner, M., Chrudimsky, D., Choe, H., Bowers, M., Yeon-seuk Kim, Chang, K.M., Smith, P.

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