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Hot carrier degradation of HV-SOI devices under off-and on-state current conditions
by
van Dalen, R.
,
Dhar, S.
,
Heringa, A.
,
Swanenberg, M. J.
,
van der Wal, A. B.
,
Boos, P. W. M.
,
Braspenning-Girault, V.
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Conference Proceedings
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Degradation
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Engineering
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Engineering, Electrical & Electronic
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Hot Carriers
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Human Computer Interaction
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Power Semiconductor Devices
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Science & Technology
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Stress
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Stress Measurement
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Technology
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Temperature Measurement
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Ieee Electronic Library (Iel) Conference Proceedings
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