Driving mechanisms of delamination related reliability problems in exposed pad packages by van Driel, W.D., Bressers, H.K.L., Janssen, J.H.J., Bielen, J.A., Yan, X., van Gils, M.A.J., Stevens, P.M.P., Habets, P.J.J.H.A., Zhang, G.Q., Ernst, L.J.

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