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Reliability of flip chip on board. First order model for the effect on contact integrity of moisture penetration in the underfill
by
Caers, J.F.J.M.
,
Oesterholt, R.
,
Bressers, R.J.L.
,
Mouthaan, T.J.
,
Verweij, J.F.
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Conference Proceedings
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90-Grad-C-Bereich
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Acceleration
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Engineering
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Engineering, Electrical & Electronic
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Epoxidunterfuellung
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Failure Analysis
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Fehleranalyse
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Flip Chip
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Geometry
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Halbleitergehaeuse
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Humidity
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Moisture
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Science & Technology
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Silicon
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Technology
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Temperature
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Temperaturschwankung
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Testing
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Thermal Expansion
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Weichlotkontakthuegel
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Ieee Electronic Library (Iel) Conference Proceedings
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Ieee Xplore All Conference Series
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