Search Results - Brillert, C.

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  1. 1
    Ultra-fast CAD scan chain highlighting for failure analysis assistance

    Ultra-fast CAD scan chain highlighting for failure analysis assistance by Grützner, M., Burmer, C., Brillert, C.

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  2. 2
    Chemical Imaging of Interfaces by Sum Frequency Microscopy

    Chemical Imaging of Interfaces by Sum Frequency Microscopy by Flörsheimer, Mathias, Brillert, Christof, Fuchs, Harald

    Published in Langmuir
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  3. 3
    Second-harmonic microscopy - a quantitative probe for molecular surface order

    Second-harmonic microscopy - a quantitative probe for molecular surface order by Flörsheimer, Mathias, Bösch, Martin, Brillert, Christof, Wierschem, Maria, Fuchs, Harald

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  4. 4
    Second-harmonic imaging of surface order and symmetry

    Second-harmonic imaging of surface order and symmetry by Flörsheimer, Mathias, Bösch, Martin, Brillert, Christof, Wierschem, Maria, Fuchs, Harald

    Published in Thin solid films
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  5. 5
    Molecular surface orientation field of a langmuir monolayer determined by second-harmonic microscopy

    Molecular surface orientation field of a langmuir monolayer determined by second-harmonic microscopy by Flörsheimer, Mathias, Salmen, Heiner, Bösch, Martin, Brillert, Christof, Wierschem, Maria, Fuchs, Harald

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  6. 6
    Frequency-locked, quasiperiodic, and chaotic motions of current-density filaments in a semiconductor device

    Frequency-locked, quasiperiodic, and chaotic motions of current-density filaments in a semiconductor device by Niedernostheide, F, Brillert, C, Kukuk, B, Purwins, H, Schulze, H

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  7. 7
    Second-harmonic imaging of ferroelectric domains in LiNbO 3 with micron resolution in lateral and axial directions

    Second-harmonic imaging of ferroelectric domains in LiNbO 3 with micron resolution in lateral and axial directions by Flörsheimer, M., Paschotta, R., Kubitscheck, U., Brillert, C., Hofmann, D., Heuer, L., Schreiber, G., Verbeek, C., Sohler, W., Fuchs, H.

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  8. 8
    Soft Defects: Challenge and Chance for Failure Analysis

    Soft Defects: Challenge and Chance for Failure Analysis by Burmer, C., Brillert, C., Zhongling Qian

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    Conference Proceeding
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  9. 9
    Chemical imaging of interfaces by sum-frequency generation

    Chemical imaging of interfaces by sum-frequency generation by Flörsheimer, Mathias, Brillert, Christof, Fuchs, Harald

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  10. 10
    Second-harmonic imaging of surface order and symmetry

    Second-harmonic imaging of surface order and symmetry by FLÖRSHEIMER, M, BÖSCH, M, BRILLERT, C, WIERSCHEM, M, FUCHS, H

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  11. 11
    Failure analysis tailored to demand a business model for high tech service

    Failure analysis tailored to demand a business model for high tech service by Boit, C.

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  12. 12
    Surface order and symmetry determined by second-harmonic microscopy

    Surface order and symmetry determined by second-harmonic microscopy by Flörsheimer, M., Bösch, M., Brillert, Ch, Wierschem, M., Fuchs, H.

    Published in Supramolecular science
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