Search Results - Brillert, Christof

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  1. 1
    Chemical Imaging of Interfaces by Sum Frequency Microscopy

    Chemical Imaging of Interfaces by Sum Frequency Microscopy by Flörsheimer, Mathias, Brillert, Christof, Fuchs, Harald

    Published in Langmuir
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  2. 2
    Second-harmonic microscopy - a quantitative probe for molecular surface order

    Second-harmonic microscopy - a quantitative probe for molecular surface order by Flörsheimer, Mathias, Bösch, Martin, Brillert, Christof, Wierschem, Maria, Fuchs, Harald

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  3. 3
    Molecular surface orientation field of a langmuir monolayer determined by second-harmonic microscopy

    Molecular surface orientation field of a langmuir monolayer determined by second-harmonic microscopy by Flörsheimer, Mathias, Salmen, Heiner, Bösch, Martin, Brillert, Christof, Wierschem, Maria, Fuchs, Harald

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  4. 4
    Spectral Gated Imaging of Dynamic Photon Emission in Mixed-Signal and Power Devices

    Spectral Gated Imaging of Dynamic Photon Emission in Mixed-Signal and Power Devices by Qian, Zhongling, Brillert, Christof

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  5. 5
    Timing analysis of scan design integrated circuits using stimulation by an infrared diode laser in externally triggered pulsing condition

    Timing analysis of scan design integrated circuits using stimulation by an infrared diode laser in externally triggered pulsing condition by Kiyan, Tuba, Brillert, Christof, Boit, Christian

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  6. 6
    Chemical imaging of interfaces by sum-frequency generation

    Chemical imaging of interfaces by sum-frequency generation by Flörsheimer, Mathias, Brillert, Christof, Fuchs, Harald

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  7. 7
    Gated imaging of dynamic photon emission in mixed-signal and power devices

    Gated imaging of dynamic photon emission in mixed-signal and power devices by Zhongling Qian, Brillert, Christof

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  8. 8
    Second-harmonic imaging of surface order and symmetry

    Second-harmonic imaging of surface order and symmetry by Flörsheimer, Mathias, Bösch, Martin, Brillert, Christof, Wierschem, Maria, Fuchs, Harald

    Published in Thin solid films
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  9. 9
    The Origin of so-called ghost modulated reflectance mapping and its application in FA

    The Origin of so-called ghost modulated reflectance mapping and its application in FA by Zhongling Qian, Brillert, Christof, Burmer, Christian

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  10. 10
    Soft Defects: Challenge and Chance for Failure Analysis

    Soft Defects: Challenge and Chance for Failure Analysis by Burmer, C., Brillert, C., Zhongling Qian

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