A Quality Metric for Defect Inspection Recipes by Buengener, R., Lee, J. L., Trapp, B. M., Rudy, J. A.

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A quality metric for defect inspection recipes by Buengener, R., Lee, J. L., Trapp, B. M., Rudy, J. A.

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A measurement of the proton structure function $f_2(x. q^2) by Ahmed, T., Aid, S., Akhundov, a A., Andreev, V., Andrieu, B., Appuhn, R D., Arpagaus, M., Babaev, A., Baehr, J., Ban, J., Baranov, P., Barrelet, E., Bartel, W., Barth, M., Bassler, U., Beck, H P., Behrend, H J., Belousov, A., Berger, C., Bergstein, H., Bernardi, G., Bernet, R., Bertrand-Coremans, G., Besancon, M., Beyer, R., Bizot, J C., Blobel, V., Borras, K., Botterweck, F., Boudry, V., Braemer, A., Brasse, F., Braunschweig, W., Brisson, V., Bruncko, D., Brune, C., Buchholz, R., Buengener, L., Buerger, J., Bsser, F W., Buniatian, A., Burke, S., Burton, M., Buschhorn, G., Campbell, a J., Carli, T., Charles, F., Clarke, D., Clegg, a B., Clerbaux, B., Colombo, M., Contreras, J G., Cormack, C., Coughlan, J A., Courau, A., Coutures, C., Cozzika, G., Criegee, L., Cussans, D G., Cvach, J., Dagoret, S., Dainton, J B., Danilov, M., Dau, W D., Daum, K., David, M., Deffur, E., Delcourt, B., del Buono, L., de Roeck, A., de Wolf, E A., Di Nezza, P., Dollfus, C., Dowell, J D., Dreis, H.B., Droutskoi, A., Duboc, J., Dllmann, D., Dnger, O., Duhm, H., Ebert, J., Ebert, T R., Eckerlin, G., Efremenko, V., Egli, S., Erlichmann, H., Eichenberger, S., Eichler, R., Eisele, F., Eisenhandler, E., Ellison, R J., Elsen, E., Erdmann, M., Erdmann, W., Evrard, E., Favart, L., Fedotov, A., Feeken, D., Felst, R., Feltesse, J.

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Process Window Centering for 22 nm lithography by Buengener, Ralf, Boye, C, Rhoads, B N, Chong, S Y, Tejwani, C, Burns, S D, Stamper, A D, Nafisi, K, Brodsky, C J, Fan, S S, Kini, S, Hahn, R

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Fatal Streptococcus suis septicemia in an abattoir worker by Büngener, W, Bialek, R

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