XPS investigation of the interaction between ECR-excited hydrogen and the native oxide of GaAs (100) by Mikhailov, G.M., Bulkin, P.V., Khudobin, S.A., Chumakov, A.A., Shapoval, S.Yu

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Automation of an electron cyclotron resonance plasma system for the manufacturing of inhomogeneous optical coatings for sensor applications by Chtcherbakov, A.A., Swart, P.L., Lacquet, B.M., Bulkin, P.V.

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Compact ECR-source of ions and radicals for semiconductor surface treatment by Shapoval, S.Yu, Bulkin, P.V., Chumakov, A.A., Khudobin, S.A., Maximov, I., Mikhailov, G.M.

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Structural analysis of the diagnostic rack locking in ITER lower port #8 by Buslakov, I.V., Kirienko, I.D., Modestov, V.S., Loginov, I.N., Senichenkov, V.A., Mukhin, E.E., Litvinov, A.E., Babinov, N.A., Tolstyakov, S.Yu, Chernakov, P.V., Marinin, G.V., Terentiev, D.V., Bulkin, R.S., Pashkovsky, S.M., Mokeev, A.N., Tanaka, S., Andrew, P., Nagy, D.

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Structural analysis of large-scale SS collecting mirrors for ITER diagnostics by Modestov, V.S., Kirienko, I.D., Buslakov, I.V., Loginov, I.N., Shagniev, O.B., Lavrova, V.A., Senichenkov, V.A., Mukhin, E.E., Litvinov, A.E., Samsonov, D.S., Tolstyakov, S.Yu, Babinov, N.A., Chernakov, P.V., Marinin, G.V., Terentiev, D.V., Bulkin, R.S., Pashkovsky, S.M., Mokeev, A.N., Tanaka, S., Andrew, P.

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