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A novel NMOS transistor for high performance ESD protection devices in 0.18 /spl mu/m CMOS technology utilizing salicide process
by
Chang-Su Kim
,
Hong-Bae Park
,
Bung-Gwan Kim
,
Dae-Gwan Kang
,
Myoung-Goo Lee
,
Si-Woo Lee
,
Chan-Hee Jeon
,
Wan-Gu Kim
,
Young-Jae Yoo
,
Han-Sub Yoon
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Conference Proceeding
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Conference Proceedings
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Cmos Process
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Cobalt
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Dielectric Materials
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Electrostatic Discharge
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Mosfets
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Protection
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Resistors
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Robustness
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Semiconductor Device Modeling
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Ieee Electronic Library (Iel) Conference Proceedings
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