A common hard-failure mechanism in GaN HEMTs in accelerated switching and single-pulse short-circuit tests by Wieland, D., Ofner, S., Stabentheiner, M., Butej, B., Koller, C., Sun, J., Minetto, A., Reiser, K., Haberlen, O., Nelhiebel, M., Glavanovics, M., Pogany, D., Ostermaier, C.

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