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Toward standardization of low impedance contact CDM
by
Jack, Nathan
,
Carn, Brett
,
Morris, Josh
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Microelectronics and reliability
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Workshop and panel discussions
by
Gossner, Harald
,
Gaertner, Reinhold
,
Carn, Brett
,
Blanc, Fabrice
,
Gauthier, Robert
,
Boselli, Gianluca
,
Duvvury, Charvaka
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Conference Proceeding
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Sampling pin approaches for ESD test applications
by
Duvvury, C.
,
Dobson, J.
,
Gauthier, R.
,
Grund, E.
,
Carn, B.
,
Stadler, W.
,
Miller, J.
,
Welsher, T.
,
Gaertner, R.
,
Ward, S.
,
Chaine, M.
,
Righter, A.
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Conference Proceeding
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Microelectronics And Reliability
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Electrostatic Discharge
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