Search Results - Cha-Ming Shen

  • Showing 1 - 3 results of 3
Refine Results
  1. 1
    Combine Micro-probing and ORBICH to Catch Non-recognizable Fault in RF and Mixed-Mode Integrated Circuits

    Combine Micro-probing and ORBICH to Catch Non-recognizable Fault in RF and Mixed-Mode Integrated Circuits by Cha-Ming Shen, Liang-Feng Wen, Tan-Chen Chuang, Chang, Y.-L., Shi-Chen Lin, Chen-May Huang, Jin-Hong Chou

    Request full text
    Conference Proceeding
    Save to List
    Saved in:
  2. 2
    Isolating failure location by using a dynamic emission microscopy system -a specific IddQ fail case study

    Isolating failure location by using a dynamic emission microscopy system -a specific IddQ fail case study by SHEN, Cha-Ming, CHEN, Chien-Hui

    Request full text
    Conference Proceeding
    Save to List
    Saved in:
  3. 3
    Couple passive voltage contrast with scanning probe microscope to identify invisible defect out

    Couple passive voltage contrast with scanning probe microscope to identify invisible defect out by Cha-Ming Shen, Jing-Hong Chou

    Request full text
    Conference Proceeding
    Save to List
    Saved in:

Search Tools: