Search Results - Chan, Daniel Sin Hung

  • Showing 1 - 2 results of 2
Refine Results
  1. 1
    Hot-carrier degradation mechanism in narrow- and wide-channel n-MOSFETs with recessed LOCOS isolation structure

    Hot-carrier degradation mechanism in narrow- and wide-channel n-MOSFETs with recessed LOCOS isolation structure by Yue, Jeffrey Mun Pun, Chim, Wai Kin, Cho, Byung Jin, Chan, Daniel Sin Hung, Qin, Wei Han, Kim, Young-Bog, Jang, Se-Aug, Yeo, In-Seok

    Get full text
    Items that this one cites
    Items that cite this one
    Article
    Save to List
    Saved in:
  2. 2
    Polymer memories: Bistable electrical switching and device performance

    Polymer memories: Bistable electrical switching and device performance by Ling, Qi-Dan, Liaw, Der-Jang, Teo, Eric Yeow-Hwee, Zhu, Chunxiang, Chan, Daniel Siu-Hung, Kang, En-Tang, Neoh, Koon-Gee

    Published in Polymer (Guilford)
    Get full text
    Items that this one cites
    Items that cite this one
    Article
    Save to List
    Saved in:

Search Tools: