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A 10-b 120-Msample/s time-interleaved analog-to-digital converter with digital background calibration
by
Jamal, S.M.
,
Daihong Fu
,
Chang, N.C.-J.
,
Hurst, P.J.
,
Lewis, S.H.
Published in
IEEE journal of solid-state circuits
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Digest Of Technical Papers - Ieee International Solid-State Circuits Conference
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Ieee Journal Of Solid-State Circuits
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Adaptive Signal Processing
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Adaptive Systems
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Analog-Digital Conversion
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Analog-To-Digital Conversion
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Apertures
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Calibration
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Channels
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Cmos Analog Integrated Circuits
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Correlation
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Delay
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Digital
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Engineering
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Engineering, Electrical & Electronic
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Error Correction
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Noise Levels
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Nonlinearity
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Science & Technology
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Signal Processing
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Signal Processing Algorithms
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