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Post-cycling data retention failure in multilevel nor flash memory with nitrided tunnel-oxide
by
Lee, W.H.
,
Chang-Hyun Hur
,
Hyun-Min Lee
,
Hwanbae Yoo
,
Sang-Eun Lee
,
Bong-Yong Lee
,
Chankwang Park
,
Kijoon Kim
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A Critical Failure Source in 65nm-MLC NOR Flash Memory Incorporating Co-Salicidation Process
by
Jeehoon Han
,
Bongyong Lee
,
Jungin Han
,
Wookhyun Kwon
,
Chaemyung Chang
,
Sangpil Sim
,
Chankwang Park
,
Kinam Kim
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Fully 3-Dimensional NOR Flash Cell with Recessed Channel and Cylindrical Floating Gate - A Scaling Direction for 65nm and Beyond
by
Sim, S.-P.
,
Kim, K.S.
,
Lee, H.K.
,
Han, J.I.
,
Kwon, W.H.
,
Han, J.H.
,
Lee, B.Y.
,
Jung, C.
,
Park, J.H.
,
Kim, D.J.
,
Jang, D.H.
,
Lee, W.H.
,
Park, C.
,
Kim, K.
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Offset-Trimming Bit-Line Sensing Scheme for Gigabit-Scale DRAM's
by
Suh, Jungwon
,
Rho, Kwangmyoung
,
Park, Chankwang
,
Koh, Yohwan
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Flash Memory
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Threshold Voltage
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Channel Hot Electron Injection
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Ieee Electronic Library (Iel) Conference Proceedings
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