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Leakage Current Analysis of 6T & 7T-SRAM using FINFETs at 22nm Technology
by
Kumar, N.Praveen
,
Charles, Dr.B.Stephen
,
Sumalatha, Dr.V.
Published in
International journal of innovative technology and exploring engineering
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International Journal Of Innovative Technology And Exploring Engineering
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Road: Directory Of Open Access Scholarly Resources
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