Search Results - Chegal, W

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  1. 1
    Dielectric function, critical points, and Rydberg exciton series of WSe2 monolayer

    Dielectric function, critical points, and Rydberg exciton series of WSe2 monolayer by Diware, M S, Ganorkar, S P, Park, K, Chegal, W, Cho, H M, Cho, Y J, Kim, Y D, Kim, H

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  2. 2
    Dielectric function of polycrystalline α -Ag2S by spectroscopic ellipsometry

    Dielectric function of polycrystalline α -Ag2S by spectroscopic ellipsometry by Diware, M. S., Ganorkar, S. P., Kim, J., Bramhe, S. N., Cho, H. M., Cho, Y. J., Chegal, W.

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  3. 3
    Solution immersed silicon (SIS)-based biosensors: a new approach in biosensing

    Solution immersed silicon (SIS)-based biosensors: a new approach in biosensing by Diware, M S, Cho, H M, Chegal, W, Cho, Y J, Jo, J H, O, S W, Paek, S H, Yoon, Y H, Kim, D

    Published in Analyst (London)
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  4. 4
    Dielectric function, critical points, and Rydberg exciton series of WSe 2 monolayer

    Dielectric function, critical points, and Rydberg exciton series of WSe 2 monolayer by Diware, M S, Ganorkar, S P, Park, K, Chegal, W, Cho, H M, Cho, Y J, Kim, Y D, Kim, H

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  5. 5
    Solution immersed silicon (SIS)-based biosensors: a new approach in biosensingElectronic supplementary information (ESI) available: Details of simulation of SIS sensor response under NRC and experiments. See DOI: 10.1039/c4an01584c

    Solution immersed silicon (SIS)-based biosensors: a new approach in biosensingElectronic supplementary information (ESI) available: Details of simulation of SIS sensor response und... by Diware, M. S, Cho, H. M, Chegal, W, Cho, Y. J, Jo, J. H, O, S. W, Paek, S. H, Yoon, Y. H, Kim, D

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  6. 6
    Calibration method for rotating-analyser-type spectral imaging ellipsometers

    Calibration method for rotating-analyser-type spectral imaging ellipsometers by Chegal, Won, Cho, Yong Jai, Oh, Se Baek, Cho, Hyun Mo, Lee, Yun Woo, Kim, Soo Hyun

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  7. 7
    Mono-axial power spectrograph for a spectral imaging ellipsometer: design and experimental results

    Mono-axial power spectrograph for a spectral imaging ellipsometer: design and experimental results by Chegal, Won, Kim, Soohyun, Kwak, Yoon Keun, Cho, Hyunmo, Lee, Yunwoo

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  8. 8
    A New Spectral Imaging Ellipsometer for Measuring the Thickness of Patterned Thin Films

    A New Spectral Imaging Ellipsometer for Measuring the Thickness of Patterned Thin Films by Chegal, Won, Cho, Yong Jai, Kim, Hyun Jong, Cho, Hyun Mo, Lee, Yun Woo, Kim, Soo Hyun

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  9. 9
    Non-destructive surface profile measurement of a thin film deposited on a patterned sample

    Non-destructive surface profile measurement of a thin film deposited on a patterned sample by Kim, Daesuk, Chegal, Won, Kim, Soohyun, Kong, Hong Jin, Lee, Yunwoo

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  10. 10
    One-dimensional Spectroscopic Measurement of Patterned Structures Using a Custom-built Spectral Imaging Ellipsometer

    One-dimensional Spectroscopic Measurement of Patterned Structures Using a Custom-built Spectral Imaging Ellipsometer by Chegal, Won, Kim, Daesuk, Kim, Soohyun, Cho, Yong Jai, Cho, Hyun Mo, Lee, Yun Woo

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