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Improvement of Multi-Lines Bridge Defect Classification by Hierarchical Architecture in Artificial Intelligence Automatic Defect Classification
by
Lin, Bing-Sheng
,
Cheng, Jung-Syuan
,
Liao, Hsiang-Chou
,
Yang, Ling-Wu
,
Yang, Tahone
,
Chen, Kuang-Chao
Published in
IEEE transactions on semiconductor manufacturing
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Ieee Transactions On Semiconductor Manufacturing
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Artificial Intelligence
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Automatic Defect Classification
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Bridges
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Classification
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Cluster Analysis
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Clustering
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Convolution
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Convolutional Neural Network
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Dislocations
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Engineering
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Engineering, Electrical & Electronic
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Engineering, Manufacturing
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Feature Extraction
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Hierarchical Structure
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Inspection
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Machine Learning
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Morphology
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Multi-Lines Bridge
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