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High-Coverage DfT and Reliability Enhancements for Automotive Floating Gate OTP Beyond AEC-Q100
by
Von Staudt, Hans Martin
,
Schuler, Franz
,
Bhattacharya, Rohitaswa
,
Cheng, Justin Wei-Lin
,
Huang, Cheng-Da
,
Chen, Parker Chih-Chun
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Aec-Q100
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Analog Circuits
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Atpg
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Automotive
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Circuit Reliability
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Computer Science
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Floating Gate
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Functional Safety
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Functional Testing
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Nonvolatile Memory
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Nvm
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Otp
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Pmic
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