Machine Learning-Based Detection Method for Wafer Test Induced Defects by Cheng, Ken Chau-Cheung, Chen, Leon Li-Yang, Li, Ji-Wei, Li, Katherine Shu-Min, Tsai, Nova Cheng-Yen, Wang, Sying-Jyan, Huang, Andrew Yi-Ann, Chou, Leon, Lee, Chen-Shiun, Chen, Jwu E., Liang, Hsing-Chung, Hsu, Chun-Lung

Get full text

TestDNA-E: Wafer Defect Signature for Pattern Recognition by Ensemble Learning by Li, Katherine Shu-Min, Chen, Leon Li-Yang, Cheng, Ken Chau-Cheung, Liao, Peter Yi-Yu, Wang, Sying-Jyan, Huang, Andrew Yi-Ann, Chou, Leon, Tsai, Nova Cheng-Yen, Lee, Chen-Shiun

Get full text

TestDNA: Novel Wafer Defect Signature for Diagnosis and Pattern Recognition by Li, Katherine Shu-Min, Tsai, Nova Cheng-Yen, Cheng, Ken Chau-Cheung, Jiang, Xu-Hao, Liao, Peter Yi-Yu, Wang, Sying-Jyan, Huang, Andrew Yi-Ann, Chou, Leon, Lee, Chen-Shiun

Get full text

Hidden Wafer Scratch Defects Projection for Diagnosis and Quality Enhancement by Li, Katherine Shu-Min, Liao, Peter Yi-Yu, Cheng, Ken Chau-Cheung, Chen, Leon Li-Yang, Wang, Sying-Jyan, Huang, Andrew Yi-Ann, Chou, Leon, Han, Gus Chang-Hung, Chen, Jwu E., Liang, Hsin-Chung, Hsu, Chung-Lung

Get full text

Wafer Scratch Pattern Reconstruction for High Diagnosis Accuracy and Yield Optimization by Li, Katherine Shu-Min, Chen, Leon Li-Yang, Liao, Peter Yi-Yu, Wang, Sying-Jyan, Huang, Andrew Yi-Ann, Chou, Leon, Tsai, Nova Cheng-Yeh, Cheng, Ken Chau-Cheung, Han, Gus Chang-Hung, Lee, Chen-Shiun, Chen, Jwu E., Liang, Hsing-Chung, Hsu, Chung-Lung

Get full text

Wafer Defect Pattern Classification with Explainable-Decision Tree Technique by Cheng, Ken Chau-Cheung, Li, Katherine Shu-Min, Wang, Sying-Jyan, Huang, Andrew Yi-Ann, Lee, Chen-Shiun, Chen, Leon Li-Yang, Liao, Peter Yi-Yu, Tsai, Nova Cheng-Yen

Request full text

TestDNA-E: Wafer Defect Signature for Pattern Recognition by Ensemble Learning by Chen, Leon Li-Yang, Li, Katherine Shu-Min, Cheng, Ken Chau-Cheung, Wang, Sying-Jyan, Huang, Andrew Yi-Ann, Chou, Leon, Tsai, Nova Cheng-Yen, Lee, Chen-Shiun

Request full text

TestDNA: Novel Wafer Defect Signature for Diagnosis and Yield Learning by Huang, Andrew Yi-Ann, Li, Katherine Shu-Min, Tsai, Cheng-Yen, Cheng, Ken Chau-Cheung, Wang, Sying-Jyan, Jiang, Xu-Hao, Chou, Leon, Lee, Chen-Shiun

Request full text

Wafer-Level Test Path Pattern Recognition and Test Characteristics for Test-Induced Defect Diagnosis by Cheng, Ken Chau-Cheung, Shu-Min Li, Katherine, Huang, Andrew Yi-Ann, Li, Ji-Wei, Chen, Leon Li-Yang, Cheng-Yen Tsai, Nova, Wang, Sying-Jyan, Lee, Chen-Shiun, Chou, Leon, Liao, Peter Yi-Yu, Liang, Hsing-Chung, Chen, Jwu-E

Request full text

Innovative Practice on Wafer Test Innovations by Hu, Dyi-Chung, Hashimoto, Hirohito, Tseng, Li-Fong, Cheng, Ken Chau-Cheung, Shu-Min Li, Katherine, Wang, Sying-Jyan, Chen, Sean Y.-S., Chen, Jwu E, Liu, Clark, Huang, Andrew

Request full text

WGrid: Wafermap Grid Pattern Recognition with Machine Learning Techniques by Liao, Peter Yi-Yu, Shu-Min Li, Katherine, Chen, Leon Li-Yang, Wang, Sying-Jyan, Huang, Andrew Yi-Ann, Chau-Cheung Cheng, Ken, Tsai, Nova Cheng-Yen, Chou, Leon

Request full text

Integrated Scratch Marker for Wafer Defect Diagnosis by Li, Katherine Shu-Min, Chen, Leon Li-Yang, Liao, Peter Yi-Yu, Wang, Sying-Jyan, Huang, Andrew Yi-Ann, Cheng, Ken Chau-Cheung

Request full text

Automatic Inspection for Wafer Defect Pattern Recognition with Unsupervised Clustering by Li, Katherine Shu-Min, Li-Yang Chen, Leon, Cheng, Ken Chau-Cheung, Yi-Yu Liao, Peter, Wang, Sying-Jyan, Huang, Andrew Yi-An, Tsai, Nova, Chou, Leon, Han, Gus Chang-Hung, Chen, Jwu E, Liang, Hsing-Chung, Hsu, Chun-Lung

Request full text