Search Results - Chetlur, Sundar

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  1. 1
    Physical origin of the permanent components of the positive charge buildup resulting from NBTI/PBTI stress in nMOS/pMOS transistors

    Physical origin of the permanent components of the positive charge buildup resulting from NBTI/PBTI stress in nMOS/pMOS transistors by Palumbo, Felix, Klebanov, Maxim, Monreal, Gerardo, Chetlur, Sundar

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  2. 2
    On the mechanism for interface trap generation in MOS transistors due to channel hot carrier stressing

    On the mechanism for interface trap generation in MOS transistors due to channel hot carrier stressing by Zhi Chen, Karl Hess, Jinju Lee, Lyding, J.W., Rosenbaum, E., Kizilyalli, I., Chetlur, S., Huang, R.

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  3. 3
    Role of holes in the isotope effect and mechanisms for the metal–oxide–semiconductor device degradation

    Role of holes in the isotope effect and mechanisms for the metal–oxide–semiconductor device degradation by Chen, Zhi, Garg, Pradeep, Singh, Vijay, Chetlur, Sundar

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  4. 4
    Synthesis of a new manufacturable high-quality graded gate oxide for sub-0.2 μm technologies

    Synthesis of a new manufacturable high-quality graded gate oxide for sub-0.2 μm technologies by Roy, P.K., Yuanning Chen, Chetlur, S.

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  5. 5
    Direct evidence of multiple vibrational excitation for the Si–H/D bond breaking in metal–oxide–semiconductor transistors

    Direct evidence of multiple vibrational excitation for the Si–H/D bond breaking in metal–oxide–semiconductor transistors by Chen, Zhi, Ong, Pangling, Mylin, Alicia Kay, Singh, Vijay, Chetlur, Sundar

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  6. 6
    An improved substrate current model for deep submicron MOSFETs

    An improved substrate current model for deep submicron MOSFETs by Li, Wei, Yuan, Jiann S., Chetlur, Sundar, Zhou, Jonathan, Oates, Anthony S.

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  7. 7
    Deuterium isotope effect for AC and DC hot-carrier degradation of MOS transistors: a comparison study

    Deuterium isotope effect for AC and DC hot-carrier degradation of MOS transistors: a comparison study by Zhi Chen, Kangguo Cheng, Jinju Lee, Lyding, J.W., Hess, K., Chetlur, S.

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