Demonstration and Modelling of Excellent RF Switch Performance of 22nm FD-SOI Technology for Millimeter-Wave Applications by Yadav, S., Chow, W.H., Bellaouar, A., Wong, J.S., Chen, T., Sekine, S., Schwan, C., Chin, M.S., Workman, G., Chew, K.W.J.

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22nm FD-SOI Technology with Back-biasing Capability Offers Excellent Performance for Enabling Efficient, Ultra-low Power Analog and RF/Millimeter-Wave Designs by Ong, S.N., Chan, L.H.K., Chew, K.W.J., Lim, C.K., Oo, W. L., Bellaouar, A., Zhang, C., Chow, W.H., Chen, T., Rassel, R., Wong, J.S., Wan, C.W.F., Kim, J., Seet, W.H., Harame, D.

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22nm Fully-Depleted SOI High Frequency Noise Modeling up to 90GHz Enabling Ultra Low Noise Millimetre-Wave LNA Design by Chan, L.H.K., Ong, S.N., Oo, W. L., Chew, K.W.J., Zhang, C., Bellaouar, A., Chow, W.H., Chen, T., Rassel, R., Wong, J.S., Lim, C.K., Wan, C.W.F., Kim, J., Seet, W.H., Harame, D.

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Excellent 22FDX Hot-Carrier Reliability for PA Applications by Chen, T., Zhang, C., Arfaoui, W., Bellaouar, A., Embabi, S., Bossu, G., Siddabathula, M., Chew, K.W.J., Ong, S. N., Mantravadi, M., Barnett, K., Bordelon, J., Taylor, R., Janardhanan, S.

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Impact of velocity saturation and hot carrier effects on channel thermal noise model of deep sub-micron MOSFETs by Ong, S.N., Yeo, K.S., Chew, K.W.J., Chan, L.H.K., Loo, X.S., Boon, C.C., Do, M.A.

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A new field dependent mobility model for high frequency channel thermal noise of deep submicron RFCMOS by Ong, S.N., Yeo, K.S., Chew, K.W.J., Chan, L.H.K., Loo, X.S., Boon, C.C., Do, M.A.

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High frequency drain current noise modeling in MOSFETs under sub-threshold condition by Chan, L.H.K., Yeo, K.S., Chew, K.W.J., Ong, S.N., Loo, X.S., Boon, C.C., Do, M.A.

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A new unified model for channel thermal noise of deep sub-micron RFCMOS by Ong, S.N., Chew, K.W.J., Yeo, K.S., Chan, L.H.K., Loo, X.S., Boon, C.C., Do, M.A.

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Analytical high frequency channel thermal noise modeling in deep sub-micron MOSFETs by Ong, S.N., Yeo, K.S., Chew, K.W.J., Chan, L.H.K., Loo, X.S., Do, M.A., Boon, C.C.

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A novel de-embedding technique for On-Wafer characterization of RF CMOS by Loo, X.S., Yeo, K.S., Chew, K.W.J., Chan, L.H.K., Ong, S.N., Do, M.A., Boon, C.C.

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Driving CMOS into the wireless communications arena with technology scaling by Chew, K.W.J., Chu, S.-F.S., Leung, C.C.C.

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