Temperature dependence of the current generated in Si bulk by Chilingarov, A

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Temperature dependence of the current generated in Si bulk by Chilingarov, A

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Operation of two stacked Peltier elements by Chilingarov, A

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Development of n+-in-p large-area silicon microstrip sensors for very high radiation environments – ATLAS12 design and initial results by Unno, Y., Edwards, S.O., Pyatt, S., Thomas, J.P., Wilson, J.A., Kierstead, J., Lynn, D., Carter, J.R., Hommels, L.B.A., Robinson, D., Bloch, I., Gregor, I.M., Tackmann, K., Betancourt, C., Jakobs, K., Kuehn, S., Mori, R., Parzefall, U., Wiik-Fucks, L., Clark, A., Ferrere, D., Gonzalez Sevilla, S., Ashby, J., Blue, A., Bates, R., Buttar, C., Doherty, F., Eklund, L., McMullen, T., McEwan, F., O׳Shea, V., Kamada, S., Yamamura, K., Ikegami, Y., Nakamura, K., Takubo, Y., Nishimura, R., Takashima, R., Chilingarov, A., Fox, H., Affolder, A.A., Allport, P.P., Casse, G., Dervan, P., Forshaw, D., Greenall, A., Wonsak, S., Wormald, M., Cindro, V., Kramberger, G., Mandic, I., Mikuz, M., Gorelov, I., Hoeferkamp, M., Palni, P., Seidel, S., Taylor, A., Toms, K., Wang, R., Hessey, N.P., Valencic, N., Arai, Y., Hanagaki, K., Dolezal, Z., Kodys, P., Bohm, J., Mikestikova, M., Bevan, A., Beck, G., Ely, S., Fadeyev, V., Galloway, Z., Grillo, A.A., Martinez-McKinney, F., Ngo, J., Parker, C., Sadrozinski, H.F.-W., Schumacher, D., Seiden, A., French, R., Hodgson, P., Marin-Reyes, H., Parker, K., Paganis, S., Jinnouchi, O., Motohashi, K., Todome, K., Yamaguchi, D., Hara, K., Hagihara, M., Garcia, C., Jimenez, J., Lacasta, C., Marti i Garcia, S., Soldevila, U.

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Charge collection and field profile studies of heavily irradiated strip sensors for the ATLAS inner tracker upgrade by Hara, K., Allport, P.P., Baca, M., Broughton, J., Chisholm, A., Nikolopoulos, K., Pyatt, S., Thomas, J.P., Wilson, J.A., Kierstead, J., Kuczewski, P., Lynn, D., Arratia, M., Hommels, L.B.A., Ullan, M., Bloch, I., Gregor, I.M., Tackmann, K., Trofimov, A., Yildirim, E., Hauser, M., Jakobs, K., Kuehn, S., Mahboubi, K., Mori, R., Parzefall, U., Clark, A., Ferrere, D., Gonzalez Sevilla, S., Ashby, J., Blue, A., Bates, R., Buttar, C., Doherty, F., McMullen, T., McEwan, F., O'Shea, V., Kamada, S., Yamamura, K., Ikegami, Y., Nakamura, K., Takubo, Y., Unno, Y., Takashima, R., Chilingarov, A., Fox, H., Affolder, A.A., Casse, G., Dervan, P., Forshaw, D., Greenall, A., Wonsak, S., Wormald, M., Cindro, V., Kramberger, G., Mandić, I., Mikuž, M., Gorelov, I., Hoeferkamp, M., Palni, P., Seidel, S., Taylor, A., Toms, K., Wang, R., Hessey, N.P., Valencic, N., Hanagaki, K., Dolezal, Z., Kodys, P., Bohm, J., Mikestikova, M., Bevan, A., Beck, G., Milke, C., Domingo, M., Fadeyev, V., Galloway, Z., Hibbard-Lubow, D., Sadrozinski, H.F.-W., Seiden, A., To, K., French, R., Hodgson, P., Marin-Reyes, H., Parker, K., Jinnouchi, O., Hara, K., Sato, K., Sato, K., Hagihara, M., Iwabuchi, S., Bernabeu, J., Civera, J.V., Garcia, C., Lacasta, C., Marti i. Garcia, S., Rodriguez, D., Santoyo, D., Solaz, C., Soldevila, U.

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Punch-through protection of SSDs in beam accidents by Sadrozinski, H.F.-W., Betancourt, C., Bielecki, A., Butko, Z., Fadeyev, V., Parker, C., Ptak, N., Wright, J., Unno, Y., Terada, S., Ikegami, Y., Kohriki, T., Mitsui, S., Hara, K., Hamasaki, N., Takahashi, Y., Chilingarov, A., Fox, H.

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Evaluation of MCM-D technology for silicon strip detectors by Eklund, L., Affolder, A., Casse, G., Chilingarov, A., Tyndel, M., Weber, M.

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Evaluation of the bulk and strip characteristics of large area n-in- p silicon sensors intended for a very high radiation environment by Bohm, J., Mikestikova, M., Affolder, A.A., Allport, P.P., Bates, R., Betancourt, C., Brown, H., Buttar, C., Carter, J.R., Casse, G., Chen, H., Chilingarov, A., Cindro, V., Clark, A., Dawson, N., DeWilde, B., Doherty, F., Dolezal, Z., Eklund, L., Fadeyev, V., Ferrere, D., Fox, H., French, R., Garcia, C., Gerling, M., Gonzalez Sevilla, S., Gorelov, I., Greenall, A., Grillo, A.A., Hara, K., Hatano, H., Hoeferkamp, M., Hommels, L.B.A., Ikegami, Y., Jakobs, K., Kierstead, J., Kodys, P., Köhler, M., Kohriki, T., Krambergen, G., Lacasta, C., Li, Z., Lindgren, S., Lynn, D., Maddock, P., Mandic, I., Marti i Garcia, S., Martinez-McKinney, F., Maunu, R., McCarthy, R., Metcalfe, J., Mikuz, M., Minano, M., Mitsui, S., O'Shea, V., Paganis, S., Parzefall, U., Puldon, D., Robinson, D., Sadrozinski, H.F.-W., Sattari, S., Schamberger, D., Seidel, S., Seiden, A., Soldevila, U., Terada, S., Toms, K., Tsionou, D., Unno, Y., Von Wilpert, J., Wormald, M., Wright, J., Yamada, M.

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Evaluating the influence of MCM-D post-processing on silicon microstrip sensors by Eklund, L, Affolder, A, Casse, G, Chilingarov, A, Matheson, J, Tyndel, M

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Interstrip capacitance stabilization at low humidity by Chilingarov, A., Campbell, D., Hughes, G.

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Evaluation of possible equivalent circuits for the description of the CV characteristics of heavily irradiated Si diodes by Campbell, D., Chilingarov, A., Sloan, T.

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Frequency and temperature dependence of the depletion voltage from CV measurements for irradiated Si detectors by Campbell, D, Chilingarov, A, Sloan, T

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Operation of heavily irradiated silicon detectors under forward bias by Chilingarov, A, Sloan, T

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A new method of carrier trapping time measurement by Brodbeck, T.J, Chilingarov, A, Sloan, T, Fretwurst, E, Kuhnke, M, Lindstroem, G

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Radiation studies and operational projections for silicon in the ATLAS inner detector by Chilingarov, A, Feick, H, Fretwurst, E, Lindström, G, Roe, S, Schulz, T

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Forward-bias operation of Si detectors:: a way to work in high-radiation environment by Beattie, L.J., Chilingarov, A., Sloan, T.

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Silicon microstrip detectors for the ATLAS SCT by Robinson, D., Allport, P., Andricek, L., Bohm, J., Buttar, C., Carter, J.R., Chilingarov, A., Clark, A.G., Ferrère, D., Fuster, J., Garcia, C., Grigson, C., Johansen, L., Lutz, G., Morone, M.C., Richter, R., Stugu, B., Unno, N.

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Frequency-temperature scaling of the CV characteristics for irradiated Si detectors by Campbell, D., Chilingarov, A., Sloan, T.

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Charge collection efficiency in heavily irradiated silicon diodes by Beattie, L, Brodbeck, T.J, Chilingarov, A, Hughes, G, Ratoff, P, Sloan, T

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Radiation damage due to NIEL in GaAs particle detectors by Chilingarov, A, Meyer, J.S, Sloan, T

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