Search Results - Chilleri, John

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  1. 1
    Industrial PLC Network Modeling and Parameter Identification Using Sensitivity Analysis and Mean Field Variational Inference

    Industrial PLC Network Modeling and Parameter Identification Using Sensitivity Analysis and Mean Field Variational Inference by Wonnacott, Raelynn, Ching, David S, Chilleri, John, Safta, Cosmin, Rashkin, Lee, Reichardt, Thomas A

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  2. 2
    Assessing the effectiveness of an empirical model for a compound semiconductor’s velocity-field characteristic

    Assessing the effectiveness of an empirical model for a compound semiconductor’s velocity-field characteristic by Chilleri, John, Wang, Yana, O’Leary, Stephen K.

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  3. 3
    Threading dislocation lines and their impact on bulk cubic boron nitride’s low-field electron transport response

    Threading dislocation lines and their impact on bulk cubic boron nitride’s low-field electron transport response by Chilleri, John, Wang, Yana, O’Leary, Stephen K.

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  4. 4
    Cubic boron nitride as a material for future electron device applications: A comparative analysis

    Cubic boron nitride as a material for future electron device applications: A comparative analysis by Chilleri, John, Siddiqua, Poppy, Shur, Michael S., O'Leary, Stephen K.

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  5. 5
    A low-field electron mobility analysis of cubic boron nitride

    A low-field electron mobility analysis of cubic boron nitride by Chilleri, John, Wang, Yana, Shur, Michael S., O’Leary, Stephen K.

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  6. 6
    Optimal allocation of computational resources based on Gaussian process: Application to molecular dynamics simulations

    Optimal allocation of computational resources based on Gaussian process: Application to molecular dynamics simulations by Chilleri, John, He, Yanyan, Bedrov, Dmitry, Kirby, Robert M.

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  7. 7
    An improved empirical model for a semiconductor’s velocity-field characteristic applied to gallium arsenide

    An improved empirical model for a semiconductor’s velocity-field characteristic applied to gallium arsenide by Chilleri, John, Wang, Yana, Shur, Michael S., O’Leary, Stephen K.

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  8. 8
    Sensitivity analysis for an electron transport system: application to the case of wurtzite gallium nitride

    Sensitivity analysis for an electron transport system: application to the case of wurtzite gallium nitride by He, Yanyan, Chilleri, John, O’Leary, Stephen K., Shur, Michael S., Kirby, Robert M.

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