Search Results - Chirokov, A
-
1
-
2
-
3
-
4
-
5
-
6
-
7
-
8
-
9
-
10
The effect of junction fringing field on radiation-induced leakage current in oxide isolation structures and nonuniform damage near the channel edges in MOSFETs
Published in IEEE Transactions on Nuclear Science (Institute of Electrical and Electronics Engineers); (United States)Get full text
Article -
11
-
12