Search Results - Chiu, Jian-Hsing

  • Showing 1 - 7 results of 7
Refine Results
  1. 1
    Active islanding detection method using d-axis disturbance signal injection with intelligent control

    Active islanding detection method using d-axis disturbance signal injection with intelligent control by Lin, Faa-Jeng, Huang, Yi-Sheng, Tan, Kuang-Hsiung, Chiu, Jian-Hsing, Chang, Yung-Ruei

    Request full text
    Items that this one cites
    Items that cite this one
    Article
    Save to List
    Saved in:
  2. 2
    Active islanding detection method using wavelet fuzzy neural network

    Active islanding detection method using wavelet fuzzy neural network by Faa-Jeng Lin, Kuang-Hsiung Tan, Jian-Hsing Chiu

    Request full text
    Conference Proceeding
    Save to List
    Saved in:
  3. 3
    In-Circuit Inductance Measurement to Correct the Single-Pulse Avalanche Energy (Eas) of Transistor Under the Unclamped Inductive-Switching (UIS) Test

    In-Circuit Inductance Measurement to Correct the Single-Pulse Avalanche Energy (Eas) of Transistor Under the Unclamped Inductive-Switching (UIS) Test by Lee, Jian-Hsing, Li, Ching-Ho, Liao, Chih-Cherng, Lin, Gong-Kai, Chiu, Yu-Sheng, Chuang, Chieh-Yao, Chen, Ke-Horng

    Get full text
    Items that this one cites
    Article
    Save to List
    Saved in:
  4. 4
    Failure mechanism for input buffer under CDM test

    Failure mechanism for input buffer under CDM test by Kao, Tzu-Cheng, Hung, Chung-Yu, Lee, Jian-Hsing, Lien, Chen-Hsin, Chiu, Chien-Wei, Lo, Kuo-Hsuan, Su, Hung-Der, Weng, Wu-Te

    Published in Electronics letters
    Request full text
    Items that this one cites
    Article
    Save to List
    Saved in:
  5. 5
    Robust ESD self-protected LDNMOSFET by an enhanced displacement-current triggering

    Robust ESD self-protected LDNMOSFET by an enhanced displacement-current triggering by Tzu-Cheng Kao, Chen-Hsin Lien, Chien-Wei Chiu, Jian-Hsing Lee, Yen-Hsiang Lo, Chung-Yu Hung, Tsung-Yi Huang, Hung-Der Su

    Request full text
    Conference Proceeding
    Save to List
    Saved in:
  6. 6
    Failure Mechanism of the Power-Clamp Device of Buck Converter during the Voltage Conversion

    Failure Mechanism of the Power-Clamp Device of Buck Converter during the Voltage Conversion by Lee, Jian-Hsing, Liu, Wu-Yang, Hung, Chung-Yu, Lo, Kuo-Hsuan, Yu, Kun-Huang, Chiu, C-W

    Request full text
    Conference Proceeding
    Save to List
    Saved in:
  7. 7
    The Influence of the Block Design on the ID-VD Curves of Power Transistor for E-SOA Characterization

    The Influence of the Block Design on the ID-VD Curves of Power Transistor for E-SOA Characterization by Chen, Chun-Chih, Chien, Shih-Chieh, Wang, Chien-Wei, Chiu, Yu-Sheng, Chuang, Jung-Tsun, Chen, Li-Fan, Chuang, Chieh-Yao, Lee, Jian-Hsing

    Request full text
    Conference Proceeding
    Save to List
    Saved in:

Search Tools: