Search Results - Choi, Yeoung Je

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  1. 1
    SAFE: Unsupervised image feature extraction using self‐attention based feature extraction network

    SAFE: Unsupervised image feature extraction using self‐attention based feature extraction network by Choi, Yeoung Je, Lee, Gyeong Taek, Kim, Chang Ouk

    Published in Expert systems
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  2. 2
    Attention Mechanism-Based Root Cause Analysis for Semiconductor Yield Enhancement Considering the Order of Manufacturing Processes

    Attention Mechanism-Based Root Cause Analysis for Semiconductor Yield Enhancement Considering the Order of Manufacturing Processes by Lee, Min Yong, Choi, Yeoung Je, Lee, Gyeong Taek, Choi, Jongkwan, Kim, Chang Ouk

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  3. 3
    Virtual Metrology Modeling for Wafer Edges via Graph Attention Networks

    Virtual Metrology Modeling for Wafer Edges via Graph Attention Networks by Joo, Jaehyeon, Yang, Keun Woo, Choi, Yeoung Je, Min, Byungwook, Kim, Chang Ouk

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