Showing
1 - 6
results of
6
Skip to content
VuFind
Log in
Library Catalogue Plus
Library
Subject guides
Databases
Referencing
Catalogue
Articles Plus
Keyword
Title
Author
Subject
Find
Advanced Search
Search Results - Choi, Zungsun
Search Results - Choi, Zungsun
Showing
1 - 6
results of
6
Refine Results
Sort
Relevance
Date Descending
Author
Title
1
Loading…
Correlation of stress and structural evolution in Li4Ti5O12-based electrodes for lithium ion batteries
by
Choi, Zungsun
,
Kramer, Dominik
,
Mönig, Reiner
Published in
Journal of power sources
Get full text
Items that this one cites
Items that cite this one
Article
Save to List
Saved in:
2
Loading…
Recycling primary batteries into advanced graphene flake-based multifunctional smart textiles for energy storage, strain sensing, electromagnetic interference shielding, antibacter...
by
Suryaprabha, Thirumalaisamy
,
Kiruthika, Thirumalaisamy
,
Selvamurugan, Paramasivam
,
Sethuraman, Mathur Gopalakrishnan
,
Ha, Heebo
,
Choi, Zungsun
,
Wang, Ergang
,
Hwang, Byungil
Published in
Journal of cleaner production
Get full text
Items that this one cites
Article
Save to List
Saved in:
3
Loading…
Research Trends and Future Perspectives on Zn-Ion Batteries Using Ga-Based Liquid Metal Coatings on Zn Anodes
by
Hong, Seungwoo
,
Choi, Zungsun
,
Hwang, Byungil
,
Matic, Aleksandar
Published in
ACS energy letters
Get full text
Items that this one cites
Article
Save to List
Saved in:
4
Loading…
Charging Ahead: The Evolution and Reliability of Nickel‐Zinc Battery Solutions
by
Bello, Idris Temitope
,
Raza, Hassan
,
Michael, Alabi Tobi
,
Muneeswara, Madithedu
,
Tewari, Neha
,
Bingsen, Wang
,
Cheung, Yin Nee
,
Choi, Zungsun
,
Boles, Steven T.
Published in
EcoMat (Beijing, China)
Get full text
Items that this one cites
Article
Save to List
Saved in:
5
Loading…
Effect of pre-existing void in sub-30nm Cu interconnect reliability
by
Zungsun Choi
,
Tsukasa, M
,
Jong Myeong Lee
,
Gil-Heyun Choi
,
Siyoung Choi
,
Joo-Tae Moon
Request full text
Conference Proceeding
Save to List
Saved in:
6
Loading…
Electromigration tests for critical stress and failure mechanism evaluation in Cu/W via/Al hybrid interconnect
by
Zungsun Choi
,
Byung-Lyul Park
,
Jong Myeong Lee
,
Gil-Heyun Choi
,
Hyeon-Deok Lee
,
Joo-Tae Moon
Request full text
Conference Proceeding
Save to List
Saved in:
Search Tools:
RSS Feed
Email Search
Save Search
Back
Refine Results
Page will reload when a filter is selected or excluded.
Limit To
Peer Reviewed
3 results
3
Full Text
6 results
6
Format
Articles
4 results
4
Conference Proceedings
2 results
2
Journal Title
Acs Energy Letters
1 results
1
Ecomat
1 results
1
Journal Of Cleaner Production
1 results
1
Journal Of Power Sources
1 results
1
Subjects
Science & Technology
6 results
6
Technology
6 results
6
Physical Sciences
5 results
5
Chemistry
3 results
3
Chemistry, Physical
3 results
3
Engineering
3 results
3
Materials Science
3 results
3
Materials Science, Multidisciplinary
3 results
3
Science & Technology - Other Topics
3 results
3
Copper
2 results
2
Current Density
2 results
2
Electrochemistry
2 results
2
Electromigration
2 results
2
Energy & Fuels
2 results
2
Engineering, Electrical & Electronic
2 results
2
Green & Sustainable Science & Technology
2 results
2
Physics
2 results
2
Reliability
2 results
2
Aluminum
1 results
1
Applied Sciences
1 results
1
Year of Publication
From:
To:
Source
Ieee Electronic Library (Iel) Conference Proceedings
2 results
2
Ieee Xplore All Conference Series
2 results
2
Sciencedirect Freedom Collection
2 results
2
Wiley-Blackwell Journals
1 results
1
Wiley-Blackwell Open Access Collection
1 results
1
American Chemical Society:jisc Collections:american Chemical Society Read & Publish Agreement 2022-2024 (Reading List)
1 results
1
Doaj Directory Of Open Access Journals
1 results
1
Ingentaconnect Journals
1 results
1
Road: Directory Of Open Access Scholarly Resources
1 results
1
Publicly Available Content (Proquest)
1 results
1
Backfile Package - Energy And Power [Yer]
1 results
1
Backfile Package - Chemical Engineering (Legacy) [Ycc]
1 results
1
Backfile Package - Environmental Science (Legacy) [Yes]
1 results
1