Search Results - Choo, Shengzi

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  1. 1
    Novel Non-Destructive Physical Bitmap Verification Technique on SRAM and NOR Flash

    Novel Non-Destructive Physical Bitmap Verification Technique on SRAM and NOR Flash by Choo, Shengzi, Atiqah Supaat, Noor Iza, Sheng Foo, Loke, Liew, Chik Hooi, Lee, Jason

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  2. 2
    Defect Finding for Power-Related Failure Due to Internal Circuitry Issue

    Defect Finding for Power-Related Failure Due to Internal Circuitry Issue by Zulkifli, Azizul Hakem, Abd Jamil, Imran Arif, Mohd Ali, Mohd Hafis, Choo, Shengzi

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    Test And Reliability Improvement With Defect-Image Classification And Machine-Learning Algorithms In Semiconductor Industry For Automotive Applications

    Test And Reliability Improvement With Defect-Image Classification And Machine-Learning Algorithms In Semiconductor Industry For Automotive Applications by Berges, Corinne, Zhang, Shilu, Leteve, Audrey, Anilturk, Onder, Bird, Jim, Lumanauw, Edwin, Shroff, Mehul D., Hakem Zulkifli, Azizul, Foo, Loke Sheng, Choo, Shengzi, Smith, Chris

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